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<front>
<journal-meta>
<journal-id journal-id-type="publisher-id">Front. Electron. Mater.</journal-id>
<journal-title>Frontiers in Electronic Materials</journal-title>
<abbrev-journal-title abbrev-type="pubmed">Front. Electron. Mater.</abbrev-journal-title>
<issn pub-type="epub">2673-9895</issn>
<publisher>
<publisher-name>Frontiers Media S.A.</publisher-name>
</publisher>
</journal-meta>
<article-meta>
<article-id pub-id-type="publisher-id">1059684</article-id>
<article-id pub-id-type="doi">10.3389/femat.2022.1059684</article-id>
<article-categories>
<subj-group subj-group-type="heading">
<subject>Electronic Materials</subject>
<subj-group>
<subject>Original Research</subject>
</subj-group>
</subj-group>
</article-categories>
<title-group>
<article-title>Intrinsic properties and dopability effects on the thermoelectric performance of binary Sn chalcogenides from first principles</article-title>
<alt-title alt-title-type="left-running-head">Bipasha et al.</alt-title>
<alt-title alt-title-type="right-running-head">
<ext-link ext-link-type="uri" xlink:href="https://doi.org/10.3389/femat.2022.1059684">10.3389/femat.2022.1059684</ext-link>
</alt-title>
</title-group>
<contrib-group>
<contrib contrib-type="author">
<name>
<surname>Bipasha</surname>
<given-names>Ferdaushi Alam</given-names>
</name>
<xref ref-type="aff" rid="aff1">
<sup>1</sup>
</xref>
<uri xlink:href="https://loop.frontiersin.org/people/2064274/overview"/>
</contrib>
<contrib contrib-type="author">
<name>
<surname>Gomes</surname>
<given-names>L&#xed;dia C.</given-names>
</name>
<xref ref-type="aff" rid="aff1">
<sup>1</sup>
</xref>
<uri xlink:href="https://loop.frontiersin.org/people/2099085/overview"/>
</contrib>
<contrib contrib-type="author">
<name>
<surname>Qu</surname>
<given-names>Jiaxing</given-names>
</name>
<xref ref-type="aff" rid="aff1">
<sup>1</sup>
</xref>
<uri xlink:href="https://loop.frontiersin.org/people/2067706/overview"/>
</contrib>
<contrib contrib-type="author" corresp="yes">
<name>
<surname>Ertekin</surname>
<given-names>Elif</given-names>
</name>
<xref ref-type="aff" rid="aff1">
<sup>1</sup>
</xref>
<xref ref-type="aff" rid="aff2">
<sup>2</sup>
</xref>
<xref ref-type="corresp" rid="c001">&#x2a;</xref>
<uri xlink:href="https://loop.frontiersin.org/people/152230/overview"/>
</contrib>
</contrib-group>
<aff id="aff1">
<sup>1</sup>
<institution>Department of Mechanical Science and Engineering</institution>, <institution>University of Illinois at Urbana-Champaign</institution>, <addr-line>Urbana</addr-line>, <addr-line>IL</addr-line>, <country>United States</country>
</aff>
<aff id="aff2">
<sup>2</sup>
<institution>Materials Research Laboratory</institution>, <institution>University of Illinois at Urbana-Champaign</institution>, <addr-line>Urbana</addr-line>, <addr-line>IL</addr-line>, <country>United States</country>
</aff>
<author-notes>
<fn fn-type="edited-by">
<p>
<bold>Edited by:</bold> <ext-link ext-link-type="uri" xlink:href="https://loop.frontiersin.org/people/1376686/overview">Ctirad Uher</ext-link>, University of Michigan, United States</p>
</fn>
<fn fn-type="edited-by">
<p>
<bold>Reviewed by:</bold> <ext-link ext-link-type="uri" xlink:href="https://loop.frontiersin.org/people/2037249/overview">Gangjian Tan</ext-link>, Wuhan University of Technology, China</p>
<p>
<ext-link ext-link-type="uri" xlink:href="https://loop.frontiersin.org/people/2037430/overview">Janusz Tobola</ext-link>, AGH University of Science and Technology, Poland</p>
<p>
<ext-link ext-link-type="uri" xlink:href="https://loop.frontiersin.org/people/2037919/overview">Matthias Agne</ext-link>, University of M&#xfc;nster, Germany</p>
<p>
<ext-link ext-link-type="uri" xlink:href="https://loop.frontiersin.org/people/2037030/overview">Lidong Zhao</ext-link>, Beihang University, China</p>
</fn>
<corresp id="c001">&#x2a;Correspondence: Elif Ertekin, <email>ertekin@illinois.edu</email>
</corresp>
<fn fn-type="other">
<p>This article was submitted to Thermoelectric Materials, a section of the journal Frontiers in Electronic Materials</p>
</fn>
</author-notes>
<pub-date pub-type="epub">
<day>24</day>
<month>11</month>
<year>2022</year>
</pub-date>
<pub-date pub-type="collection">
<year>2022</year>
</pub-date>
<volume>2</volume>
<elocation-id>1059684</elocation-id>
<history>
<date date-type="received">
<day>01</day>
<month>10</month>
<year>2022</year>
</date>
<date date-type="accepted">
<day>07</day>
<month>11</month>
<year>2022</year>
</date>
</history>
<permissions>
<copyright-statement>Copyright &#xa9; 2022 Bipasha, Gomes, Qu and Ertekin.</copyright-statement>
<copyright-year>2022</copyright-year>
<copyright-holder>Bipasha, Gomes, Qu and Ertekin</copyright-holder>
<license xlink:href="http://creativecommons.org/licenses/by/4.0/">
<p>This is an open-access article distributed under the terms of the Creative Commons Attribution License (CC BY). The use, distribution or reproduction in other forums is permitted, provided the original author(s) and the copyright owner(s) are credited and that the original publication in this journal is cited, in accordance with accepted academic practice. No use, distribution or reproduction is permitted which does not comply with these terms.</p>
</license>
</permissions>
<abstract>
<p>High-performance thermoelectric (TE) materials rely on semiconductors with suitable intrinsic properties for which carrier concentrations can be controlled and optimized. To demonstrate the insights that can be gained in computational analysis when both intrinsic properties and dopability are considered in tandem, we combine the prediction of TE quality factor (intrinsic properties) with first-principles simulations of native defects and carrier concentrations for the binary Sn chalcogenides SnS, SnSe, and SnTe. The computational predictions are compared to a comprehensive data set of previously reported TE figures-of-merit for each material, for both p-type and n-type carriers. The combined analysis reveals that dopability limits constrain the TE performance of each Sn chalcogenide in a distinct way. In SnS, TE performance for both p-type and n-type carriers is hindered by low carrier concentrations, and improved performance is possible only if higher carrier concentrations can be achieved by suitable extrinsic dopants. For SnSe, the p-type performance of the <italic>Cmcm</italic> phase appears to have reached its theoretical potential, while improvements in n-type performance may be possible through tuning of electron carrier concentrations in the <italic>Pnma</italic> phase. Meanwhile, assessment of the defect chemistry of SnTe reveals that p-type TE performance is limited by, and n-type performance is not possible due to, the material&#x2019;s degenerate p-type nature. This analysis highlights the benefits of accounting for both intrinsic and extrinsic properties in a computation-guided search, an approach that can be applied across diverse sets of semiconductor materials for TE applications.</p>
</abstract>
<kwd-group>
<kwd>thermoelectrics</kwd>
<kwd>first principles</kwd>
<kwd>semiconductors</kwd>
<kwd>dopability</kwd>
<kwd>chalcogenides</kwd>
</kwd-group>
<contract-sponsor id="cn001">National Science Foundation<named-content content-type="fundref-id">10.13039/100000001</named-content>
</contract-sponsor>
</article-meta>
</front>
<body>
<sec id="s1">
<title>1 Introduction</title>
<p>The discovery of new thermoelectric (TE) semiconductors is most commonly based on predicting or measuring the figure of merit <italic>zT</italic> (<xref ref-type="bibr" rid="B47">Madsen, 2006</xref>; <xref ref-type="bibr" rid="B83">Zhu et al., 2015</xref>; <xref ref-type="bibr" rid="B23">Fang et al., 2017</xref>; <xref ref-type="bibr" rid="B44">Li et al., 2018</xref>; <xref ref-type="bibr" rid="B15">Chami et al., 2020</xref>; <xref ref-type="bibr" rid="B27">Gan et al., 2021</xref>; <xref ref-type="bibr" rid="B25">Fu et al., 2015</xref>; <xref ref-type="bibr" rid="B78">Zhao et al., 2014</xref>). While <italic>zT</italic> is effective for evaluating a material&#x2019;s TE performance, it is a composite parameter that arises from intrinsic material properties such as carrier effective masses and thermal conductivity, as well as extrinsic properties such as temperature and carrier concentration (<xref ref-type="bibr" rid="B67">Snyder and Toberer, 2008</xref>; <xref ref-type="bibr" rid="B30">Gorai et al., 2017</xref>). Consequently, measurements or predictions of <italic>zT</italic> alone may mask key performance bottlenecks. If a semiconductor is shown to have low <italic>zT</italic>, it is not always obvious if improvements are needed in the material itself or if the carrier concentration should be further optimized by doping. Additionally, semiconductors that exhibit high carrier mobilities and low thermal conductivity can still be poor TEs if they cannot be doped to the desired carrier concentration, as in n-type GeTe (<xref ref-type="bibr" rid="B63">Samanta et al., 2019</xref>) and Sr<sub>3</sub>GaSb<sub>3</sub> (<xref ref-type="bibr" rid="B76">Zevalkink et al., 2012</xref>). For accelerated TE materials discovery and optimization, the roles of intrinsic material properties and dopability should be considered in tandem and their effects disambiguated.</p>
<p>One well-known and technologically-relevant class of TE materials that exhibit a diversity of behaviors in intrinsic properties and dopability are the binary IV-VI chalcogenides. These compounds exhibit crystal structures including orthorhombic (GeS and GeSe&#x2014;space group <italic>Pnma</italic>, SnS and SnSe&#x2014;space groups <italic>Pnma</italic> and <italic>Cmcm</italic>), rhombohedral (GeTe&#x2014;space group <italic>R3m</italic>), and rock salt (SnTe, PbS, PbSe, and PbTe&#x2014;space group <italic>Fm3m</italic>). As this family of materials already exhibits anharmonicity-induced ultra-low thermal conductivities (<xref ref-type="bibr" rid="B41">Lee et al., 2014</xref>), opportunities for improvement lie in optimizing electronic properties and carrier concentrations. Experimentally it is observed that PbTe (<xref ref-type="bibr" rid="B74">Wu et al., 2015</xref>) achieves a <italic>zT</italic> of 2.3 and GeTe (<xref ref-type="bibr" rid="B44">Li et al., 2018</xref>) achieves a <italic>zT</italic> of 2.4 both at hole concentrations <inline-formula id="inf1">
<mml:math id="m1">
<mml:mo>&#x223c;</mml:mo>
<mml:mn>1</mml:mn>
<mml:msup>
<mml:mrow>
<mml:mn>0</mml:mn>
</mml:mrow>
<mml:mrow>
<mml:mn>20</mml:mn>
</mml:mrow>
</mml:msup>
</mml:math>
</inline-formula> cm<sup>&#x2212;3</sup>, while SnSe (<xref ref-type="bibr" rid="B78">Zhao et al., 2014</xref>) shows higher performance (<italic>zT</italic> &#x3d; 2.6) at a lower hole concentration <inline-formula id="inf2">
<mml:math id="m2">
<mml:mo>&#x223c;</mml:mo>
<mml:mn>1</mml:mn>
<mml:msup>
<mml:mrow>
<mml:mn>0</mml:mn>
</mml:mrow>
<mml:mrow>
<mml:mn>19</mml:mn>
</mml:mrow>
</mml:msup>
</mml:math>
</inline-formula> cm<sup>&#x2212;3</sup>. Experimental work on binary IV-VI chalcogenides has historically focused on p-type compositions, yielding state-of-the-art performances, e.g. PbTe (<xref ref-type="bibr" rid="B54">Pei et al., 2011a</xref>; <xref ref-type="bibr" rid="B74">Wu et al., 2015</xref>; <xref ref-type="bibr" rid="B35">Hu et al., 2016</xref>; <xref ref-type="bibr" rid="B9">Biswas et al., 2012</xref>), GeTe (<xref ref-type="bibr" rid="B43">Li et al., 2016</xref>; <xref ref-type="bibr" rid="B55">Pei et al., 2011b</xref>; <xref ref-type="bibr" rid="B62">Samanta and Biswas, 2017</xref>; <xref ref-type="bibr" rid="B2">Adamczyk et al., 2022</xref>), SnSe (<xref ref-type="bibr" rid="B78">Zhao et al., 2014</xref>; <xref ref-type="bibr" rid="B79">2015</xref>). More recently, their n-type performances have been characterized as well, such as SnSe (<italic>zT</italic> &#x3d; 2.2, <xref ref-type="bibr" rid="B22">Duong et al., 2016</xref>) and PbTe (<italic>zT</italic> &#x3d; 1.8, <xref ref-type="bibr" rid="B26">Fu et al., 2017</xref>). Detailed analysis of dopability using both experiment and computation (<xref ref-type="bibr" rid="B31">Goyal et al., 2017</xref>; <xref ref-type="bibr" rid="B49">Male et al., 2019</xref>) established the route for n-type doping of PbTe. These studies invite questions about whether optimal performance has been achieved, or if any of the IV-VI binaries have potential for TE improvement by doping optimization. Assessing this possibility requires analysis of both intrinsic properties and dopability, to identify the most effective routes to increase <italic>zT</italic>.</p>
<p>Amongst a variety of methods that predict TE performance (<xref ref-type="bibr" rid="B48">Madsen and Singh, 2006</xref>; <xref ref-type="bibr" rid="B46">Madsen et al., 2018</xref>; <xref ref-type="bibr" rid="B28">Ganose et al., 2021</xref>), the thermoelectric quality factor approach (<xref ref-type="bibr" rid="B17">Chasmar and Stratton, 1959</xref>) (<xref ref-type="fig" rid="F1">Figure 1</xref>) obtains <italic>zT</italic> in terms of two independent variables, the quality factor <italic>&#x3b2;</italic> and the reduced Fermi level <italic>&#x3b7;</italic>. Since <italic>&#x3b2;</italic> is a measure of intrinsic properties and <italic>&#x3b7;</italic> depends on doping and temperature, the quality factor approach cleanly separates <italic>zT</italic> into its intrinsic and extrinsic constituents. The development of semi-empirical models (<xref ref-type="bibr" rid="B75">Yan et al., 2015</xref>; <xref ref-type="bibr" rid="B50">Miller et al., 2017</xref>) to evaluate carrier mobilities and thermal conductivity (<xref ref-type="fig" rid="F1">Figure 1A</xref>) has made high-throughput assessment of <italic>&#x3b2;</italic> possible (<xref ref-type="bibr" rid="B29">Gorai et al., 2015</xref>; <xref ref-type="bibr" rid="B51">Ohno et al., 2018</xref>; <xref ref-type="bibr" rid="B49">Male et al., 2019</xref>; <xref ref-type="bibr" rid="B59">Qu et al., 2020</xref>). The dopability of a material can be evaluated through first-principles analysis of defect formation energies (<xref ref-type="bibr" rid="B24">Freysoldt et al., 2014</xref>) to establish the limits of achievable n-type and p-type carrier concentration and <italic>&#x3b7;</italic> (<xref ref-type="fig" rid="F1">Figure 1B</xref>). As shown in <xref ref-type="fig" rid="F1">Figure 1C</xref>), the union of intrinsic properties and dopability yield the achievable <italic>zT</italic> for a given material. The peak values observed in plots of <italic>zT</italic> vs. carrier concentration typically occur at carrier concentrations between 10<sup>19</sup>&#x2013;10<sup>20</sup>&#xa0;cm<sup>&#x2212;3</sup>, making a defect engineering approach essential. In materials where compensating defects are prevalent, the peak <italic>zT</italic> may not be accessible, leading to wasted time and effort. Compensating defects refer to low energy native defects in a semiconductor that counteract attempts to dope the material; for example it is not possible to dope CuInTe<sub>2</sub> n-type due to the prevalence of compensating copper vacancies V<sub>Cu</sub> that counteract the doping (<xref ref-type="bibr" rid="B3">Adamczyk et al. (2020)</xref>). Additionally, the more ideal the intrinsic properties the less stringent the demands on carrier concentration: the larger the quality factor <italic>&#x3b2;</italic>, the lower the carrier concentration at which <italic>zT</italic> peaks and the higher the peak value.</p>
<fig id="F1" position="float">
<label>FIGURE 1</label>
<caption>
<p>
<bold>(A)</bold> Hypothetical computational search for good thermoelectric materials using material quality factor <italic>&#x3b2;</italic> (<xref ref-type="bibr" rid="B75">Yan et al., 2015</xref>; <xref ref-type="bibr" rid="B50">Miller et al., 2017</xref>) to predict intrinsic properties. <bold>(B)</bold> First-principles analysis of the formation energies of compensating defects (<xref ref-type="bibr" rid="B24">Freysoldt et al., 2014</xref>) to establish the limits of achievable n-type and p-type carrier concentration. <bold>(C)</bold> Prediction of <italic>zT</italic> from combined quality factor <italic>&#x3b2;</italic> and dopability (<xref ref-type="bibr" rid="B17">Chasmar and Stratton, 1959</xref>). Each curve represents a different value of <italic>&#x3b2;</italic>.</p>
</caption>
<graphic xlink:href="femat-02-1059684-g001.tif"/>
</fig>
<p>To highlight the effects of assessing both intrinsic properties and dopability in computational analysis, in this work we apply the TE quality factor approach to the prediction of <italic>zT</italic> in well-known Sn-based IV-VI binary compounds SnS, SnSe, and SnTe. Amongst the IV-VI binaries, we focus on Sn-based compounds due to their varying crystal structure (<italic>Pnma</italic>, <italic>Cmcm</italic>, and <italic>Fm3m</italic>) as well as recent demonstrations of n-type performance (<xref ref-type="bibr" rid="B22">Duong et al., 2016</xref>; <xref ref-type="bibr" rid="B12">Cai J et al., 2020</xref>; <xref ref-type="bibr" rid="B32">Gu et al., 2021</xref>; <xref ref-type="bibr" rid="B77">Zhang et al., 2015</xref>; <xref ref-type="bibr" rid="B14">Cha et al., 2019</xref>; <xref ref-type="bibr" rid="B34">Hu et al., 2019</xref>; <xref ref-type="bibr" rid="B80">Zhi-Cheng et al., 2019</xref>). We first apply the TE quality factor formalism for both p-type and n-type carriers by estimating <italic>&#x3b2;</italic> for each compound to predict the dependence of <italic>zT</italic> on carrier concentration. Our results are compared to a comprehensive literature search of reported <italic>zT</italic> values for each compound, which reveals opportunities for improvement for all three materials <italic>via</italic> carrier concentration refinement. We next carry out analysis of achievable carrier concentrations for each, and find that native defects and dopability restrict the performance of all three materials differently. Even with the limitations imposed by carrier concentration analysis, some of the Sn chalcogenides show opportunities for improvement if good extrinsic dopants can be found. The application of the quality factor approach highlights the advantages of distinguishing between the roles of intrinsic properties and dopability, as an avenue for accelerated optimization of thermoelectric materials.</p>
</sec>
<sec id="s2">
<title>2 Methods</title>
<sec id="s2-1">
<title>2.1 DFT simulations&#x2014;General approach</title>
<p>First-principles density functional theory (DFT) calculations were used for estimating both the thermoelectric quality factor <italic>&#x3b2;</italic> and the dopability of each compound. In all cases, these simulations were performed using the Vienna Ab-initio Simulation Package (VASP, <xref ref-type="bibr" rid="B37">Kresse and Furthm&#xfc;ller (1996)</xref>), within the projector augmented wave (PAW) formalism (<xref ref-type="bibr" rid="B10">Bl&#xf6;chl (1994)</xref>). We used pseudopotentials with core/valence electrons as follows: Sn: [Kr]4d<sup>10</sup>:5s<sup>2</sup>5p<sup>2</sup>, S: [Ne]:3s<sup>2</sup>3p<sup>2</sup>, Se: [Ar]4d<sup>10</sup>:4s<sup>2</sup>4p<sup>4</sup>, Te: [Kr]4d<sup>10</sup>:5s<sup>2</sup>5p<sup>4</sup>. As described below, both the Perdew-Burke-Eznerhof (DFT-PBE, <xref ref-type="bibr" rid="B56">Perdew et al. (1996)</xref>) and the Heyd-Scuseria-Eznerhof (DFT-HSE, <xref ref-type="bibr" rid="B38">Krukau et al. (2006)</xref>) description of the exchange correlation potential were used. A plane wave energy cutoff of 400&#xa0;eV and, for bulk unit cells, a &#x393;-centred k-point mesh of 5 &#xd7; 5 &#xd7; 5 were used to perform the relaxation. The total energy and force convergence criteria used for all geometry optimizations were 10<sup>&#x2013;5</sup>&#xa0;eV and 0.01&#xa0;eV/&#xc5;, respectively.</p>
</sec>
<sec id="s2-2">
<title>2.2 Thermoelectric quality factor <italic>&#x3b2;</italic>
</title>
<p>The thermoelectric quality factor was obtained using DFT-PBE, with spin-orbit coupling included for PbTe and SnTe. Here, we used DFT-PBE rather than DFT-HSE since dense k-meshes are required to converge computed parameters. Relaxed structures obtained as described above were used for subsequent electronic band structure and bulk modulus calculations.</p>
<p>The semi-empirical model to predict each material&#x2019;s intrinsic mobility (<xref ref-type="bibr" rid="B75">Yan et al., 2015</xref>; <xref ref-type="bibr" rid="B50">Miller et al., 2017</xref>) requires density of states effective mass <inline-formula id="inf3">
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</mml:mrow>
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</mml:mrow>
<mml:mrow>
<mml:mo>&#x2a;</mml:mo>
</mml:mrow>
</mml:msubsup>
</mml:math>
</inline-formula> and band degeneracy <italic>N</italic>
<sub>
<italic>b</italic>
</sub>. From these, the band effective mass <inline-formula id="inf4">
<mml:math id="m4">
<mml:msubsup>
<mml:mrow>
<mml:mi>m</mml:mi>
</mml:mrow>
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<mml:mi>b</mml:mi>
</mml:mrow>
<mml:mrow>
<mml:mo>&#x2a;</mml:mo>
</mml:mrow>
</mml:msubsup>
</mml:math>
</inline-formula> is obtained by <inline-formula id="inf5">
<mml:math id="m5">
<mml:msubsup>
<mml:mrow>
<mml:mi>m</mml:mi>
</mml:mrow>
<mml:mrow>
<mml:mi mathvariant="italic">DOS</mml:mi>
</mml:mrow>
<mml:mrow>
<mml:mo>&#x2a;</mml:mo>
</mml:mrow>
</mml:msubsup>
<mml:mo>&#x3d;</mml:mo>
<mml:msubsup>
<mml:mrow>
<mml:mi>N</mml:mi>
</mml:mrow>
<mml:mrow>
<mml:mi>b</mml:mi>
</mml:mrow>
<mml:mrow>
<mml:mn>2</mml:mn>
<mml:mo>/</mml:mo>
<mml:mn>3</mml:mn>
</mml:mrow>
</mml:msubsup>
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</mml:mrow>
<mml:mrow>
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<mml:mrow>
<mml:mo>&#x2a;</mml:mo>
</mml:mrow>
</mml:msubsup>
</mml:math>
</inline-formula>, under the assumption of symmetry equivalent and isotropic bands. The DOS effective masses and band degeneracies themselves were obtained using dense k-mesh calculations carried out on unit cells. For SnTe and PbTe, a kpoint mesh of 20 &#xd7; 20 &#xd7; 20 was used for the 2-atom primitive cell. Since the VBM and CBM of both SnS and SnSe occur between high-symmetry corners of the Brillouin zone, a denser k-mesh of 28 &#xd7; 28 &#xd7; 28 was needed to converge <inline-formula id="inf6">
<mml:math id="m6">
<mml:msubsup>
<mml:mrow>
<mml:mi>m</mml:mi>
</mml:mrow>
<mml:mrow>
<mml:mi mathvariant="italic">DOS</mml:mi>
</mml:mrow>
<mml:mrow>
<mml:mo>&#x2a;</mml:mo>
</mml:mrow>
</mml:msubsup>
</mml:math>
</inline-formula> and <italic>N</italic>
<sub>
<italic>b</italic>
</sub> for the 8 atom unit cell (see <xref ref-type="sec" rid="s10">Supplementary Figure S1</xref>). The DOS effective mass is extracted from a 100&#xa0;meV energy window from the DOS at the VBM and CBM under the parabolic band approximation.</p>
<p>The semi-empirical model used to predict lattice thermal conductivity (<xref ref-type="bibr" rid="B75">Yan et al., 2015</xref>; <xref ref-type="bibr" rid="B50">Miller et al., 2017</xref>) requires the bulk modulus as an input. This was obtained by fitting the Birch&#x2013;Murnaghan (<xref ref-type="bibr" rid="B8">Birch, 1952</xref>) equation of state to a set of total energies computed at 5 different volumes near the minimum volume of the relaxed structure.</p>
<p>We note that both models predict intrinsic properties assuming pure material without any defects, while quantities like mobility and lattice thermal conductivity can be affected if defects or impurities are present in the system at high concentration.</p>
</sec>
<sec id="s2-3">
<title>2.3 Dopability analysis</title>
<p>For all aspects of dopability assessment (except <inline-formula id="inf7">
<mml:math id="m7">
<mml:msubsup>
<mml:mrow>
<mml:mi>m</mml:mi>
</mml:mrow>
<mml:mrow>
<mml:mi mathvariant="italic">DOS</mml:mi>
</mml:mrow>
<mml:mrow>
<mml:mo>&#x2a;</mml:mo>
</mml:mrow>
</mml:msubsup>
</mml:math>
</inline-formula> as described above) including phase stability, band gaps, and defect formation energies, we used DFT-HSE. Optimized lattice constants and internal coordinates were obtained form HSE06 (<xref ref-type="bibr" rid="B38">Krukau et al., 2006</xref>) with an exchange mixing of <italic>&#x3b1;</italic> &#x3d; 0.2. A comparison of DFT-predicted and experimental lattice constants and band gaps are shown in <xref ref-type="sec" rid="s10">Supplementary Table S1</xref>.</p>
<sec id="s2-3-1">
<title>2.3.1 Phase stability</title>
<p>The thermodynamic stability of each binary Sn chalcogenide was determined against all competing phases, including elemental phases (Sn, S, Se, and Te) and binaries SnS<sub>2</sub> and SnSe<sub>2</sub>, whose total energies were obtained <italic>via</italic> geometry optimization as described above. The range of chemical potentials &#x394;<italic>&#x3bc;</italic> for which the parent compound is stable was obtained from the total energies, by requiring that the compound of interest be stable with respect to decomposition to all possible competing phases.</p>
</sec>
<sec id="s2-3-2">
<title>2.3.2 Native defect formation energies and carrier concentrations</title>
<p>We used the standard supercell approach (<xref ref-type="bibr" rid="B40">Lany and Zunger, 2008</xref>) to determine the formation energies of native point defects to establish dopability. The formation energy &#x394;<italic>H</italic>
<sub>D,<italic>q</italic>
</sub> of point defect <italic>D</italic> in charge state <italic>q</italic> is given by<disp-formula id="e1">
<mml:math id="m8">
<mml:mi mathvariant="normal">&#x394;</mml:mi>
<mml:msub>
<mml:mrow>
<mml:mi>H</mml:mi>
</mml:mrow>
<mml:mrow>
<mml:mi mathvariant="normal">D</mml:mi>
<mml:mo>,</mml:mo>
<mml:mi>q</mml:mi>
</mml:mrow>
</mml:msub>
<mml:mo>&#x3d;</mml:mo>
<mml:msub>
<mml:mrow>
<mml:mi>E</mml:mi>
</mml:mrow>
<mml:mrow>
<mml:mi mathvariant="normal">D</mml:mi>
<mml:mo>,</mml:mo>
<mml:mi>q</mml:mi>
</mml:mrow>
</mml:msub>
<mml:mo>&#x2212;</mml:mo>
<mml:msub>
<mml:mrow>
<mml:mi>E</mml:mi>
</mml:mrow>
<mml:mrow>
<mml:mi mathvariant="normal">H</mml:mi>
</mml:mrow>
</mml:msub>
<mml:mo>&#x2212;</mml:mo>
<mml:munder>
<mml:mrow>
<mml:mo>&#x2211;</mml:mo>
</mml:mrow>
<mml:mrow>
<mml:mi>i</mml:mi>
</mml:mrow>
</mml:munder>
<mml:msub>
<mml:mrow>
<mml:mi>n</mml:mi>
</mml:mrow>
<mml:mrow>
<mml:mi>i</mml:mi>
</mml:mrow>
</mml:msub>
<mml:msub>
<mml:mrow>
<mml:mi>&#x3bc;</mml:mi>
</mml:mrow>
<mml:mrow>
<mml:mi>i</mml:mi>
</mml:mrow>
</mml:msub>
<mml:mo>&#x2b;</mml:mo>
<mml:mi>q</mml:mi>
<mml:msub>
<mml:mrow>
<mml:mi>E</mml:mi>
</mml:mrow>
<mml:mrow>
<mml:mi mathvariant="normal">F</mml:mi>
</mml:mrow>
</mml:msub>
<mml:mo>&#x2b;</mml:mo>
<mml:msub>
<mml:mrow>
<mml:mi>E</mml:mi>
</mml:mrow>
<mml:mrow>
<mml:mtext>corr</mml:mtext>
</mml:mrow>
</mml:msub>
<mml:mspace width="5.0pt"/>
<mml:mo>,</mml:mo>
</mml:math>
<label>(1)</label>
</disp-formula>where <italic>E</italic>
<sub>D,<italic>q</italic>
</sub> and <italic>E</italic>
<sub>H</sub> represent total energies of a defect supercell and a host supercell without defects, respectively; <italic>&#x3bc;</italic>
<sub>i</sub> is the chemical potential of element <italic>i</italic> added (<italic>n</italic>
<sub>i</sub> &#x3e; 0) or removed (<italic>n</italic>
<sub>i</sub> &#x3c; 0) from the host to create the defect; <italic>E</italic>
<sub>F</sub> is the Fermi energy varying from the VBM to CBM; and <italic>E</italic>
<sub>corr</sub> refers to the finite size corrections within the supercell approach. The corrections included in evaluating &#x394;<italic>H</italic>
<sub>D,<italic>q</italic>
</sub> were (i) potential alignment corrections and (ii) image charge corrections for charged defects as described by <xref ref-type="bibr" rid="B40">Lany and Zunger (2008)</xref>. To evaluate image charge corrections, the electronic and ionic dielectric constant was calculated using density functional perturbation theory (DFPT) as implemented in VASP (<xref ref-type="bibr" rid="B37">Kresse and Furthm&#xfc;ller, 1996</xref>).</p>
<p>For defect calculations of SnS, SnSe, and SnTe we built supercells of 72, 72, and 64 atoms, respectively, and relaxed the structure with HSE06 to calculate the total energies of the supercells. The supercells were relaxed using Brillouin zone sampling with a &#x393;-centered 2 &#xd7; 2 &#xd7; 2 k-point grid.</p>
<p>Defect concentration, carrier concentration, and equilibrium Fermi energy were determined by assuming equilibrium defect concentrations and imposing charge neutrality. The charge neutrality condition is given by<disp-formula id="e2">
<mml:math id="m9">
<mml:munder>
<mml:mrow>
<mml:mo>&#x2211;</mml:mo>
</mml:mrow>
<mml:mrow>
<mml:mi>D</mml:mi>
</mml:mrow>
</mml:munder>
<mml:mi>q</mml:mi>
<mml:msub>
<mml:mrow>
<mml:mi>C</mml:mi>
</mml:mrow>
<mml:mrow>
<mml:mi mathvariant="normal">D</mml:mi>
<mml:mo>,</mml:mo>
<mml:mi>q</mml:mi>
</mml:mrow>
</mml:msub>
<mml:mo>&#x2212;</mml:mo>
<mml:mi>n</mml:mi>
<mml:mo>&#x2b;</mml:mo>
<mml:mi>p</mml:mi>
<mml:mo>&#x3d;</mml:mo>
<mml:mn>0</mml:mn>
<mml:mspace width="5.0pt"/>
<mml:mo>,</mml:mo>
</mml:math>
<label>(2)</label>
</disp-formula>where <italic>q</italic> is the charge state of the defects, <italic>n</italic> and <italic>p</italic> are the free electron and hole concentrations, and <italic>C</italic>
<sub>
<italic>D</italic>,<italic>q</italic>
</sub> is the defect concentrations, respectively. <italic>C</italic>
<sub>D,<italic>q</italic>
</sub> is obtained by<disp-formula id="e3">
<mml:math id="m10">
<mml:msub>
<mml:mrow>
<mml:mi>C</mml:mi>
</mml:mrow>
<mml:mrow>
<mml:mi mathvariant="normal">D</mml:mi>
<mml:mo>,</mml:mo>
<mml:mi>q</mml:mi>
</mml:mrow>
</mml:msub>
<mml:mo>&#x3d;</mml:mo>
<mml:mi>N</mml:mi>
<mml:mo>&#x2061;</mml:mo>
<mml:mi>exp</mml:mi>
<mml:mfenced open="(" close=")">
<mml:mrow>
<mml:mo>&#x2212;</mml:mo>
<mml:mfrac>
<mml:mrow>
<mml:mi mathvariant="normal">&#x394;</mml:mi>
<mml:msub>
<mml:mrow>
<mml:mi>H</mml:mi>
</mml:mrow>
<mml:mrow>
<mml:mi mathvariant="normal">D</mml:mi>
<mml:mo>,</mml:mo>
<mml:mi>q</mml:mi>
</mml:mrow>
</mml:msub>
</mml:mrow>
<mml:mrow>
<mml:msub>
<mml:mrow>
<mml:mi>k</mml:mi>
</mml:mrow>
<mml:mrow>
<mml:mi>B</mml:mi>
</mml:mrow>
</mml:msub>
<mml:mi>T</mml:mi>
</mml:mrow>
</mml:mfrac>
</mml:mrow>
</mml:mfenced>
</mml:math>
<label>(3)</label>
</disp-formula>where <italic>N</italic> is the concentration of the lattice sites, <italic>k</italic>
<sub>
<italic>B</italic>
</sub> is the Boltzmann constant, and <italic>H</italic>
<sub>D,<italic>q</italic>
</sub> is the defect formation energy.</p>
<p>In <xref ref-type="disp-formula" rid="e2">Eq. 2</xref>, <italic>n</italic> and <italic>p</italic> can be obtained by<disp-formula id="e4">
<mml:math id="m11">
<mml:mtable class="align" columnalign="left">
<mml:mtr>
<mml:mtd columnalign="right">
<mml:mi>n</mml:mi>
</mml:mtd>
<mml:mtd columnalign="left">
<mml:mo>&#x3d;</mml:mo>
<mml:mspace width="0.3333em"/>
<mml:msubsup>
<mml:mrow>
<mml:mo>&#x222b;</mml:mo>
</mml:mrow>
<mml:mrow>
<mml:msub>
<mml:mrow>
<mml:mi>E</mml:mi>
</mml:mrow>
<mml:mrow>
<mml:mtext>CBM</mml:mtext>
</mml:mrow>
</mml:msub>
</mml:mrow>
<mml:mrow>
<mml:mi>&#x221e;</mml:mi>
</mml:mrow>
</mml:msubsup>
<mml:msub>
<mml:mrow>
<mml:mi>D</mml:mi>
</mml:mrow>
<mml:mrow>
<mml:mi>C</mml:mi>
</mml:mrow>
</mml:msub>
<mml:mfenced open="(" close=")">
<mml:mrow>
<mml:mi>&#x3f5;</mml:mi>
</mml:mrow>
</mml:mfenced>
<mml:mi>f</mml:mi>
<mml:mfenced open="(" close=")">
<mml:mrow>
<mml:mi>&#x3f5;</mml:mi>
</mml:mrow>
</mml:mfenced>
<mml:mspace width="0.17em"/>
<mml:mi>d</mml:mi>
<mml:mi>&#x3f5;</mml:mi>
<mml:mspace width="5.0pt"/>
<mml:mo>,</mml:mo>
</mml:mtd>
</mml:mtr>
<mml:mtr>
<mml:mtd columnalign="right">
<mml:mi>p</mml:mi>
</mml:mtd>
<mml:mtd columnalign="left">
<mml:mo>&#x3d;</mml:mo>
<mml:mspace width="0.3333em"/>
<mml:msubsup>
<mml:mrow>
<mml:mo>&#x222b;</mml:mo>
</mml:mrow>
<mml:mrow>
<mml:mo>&#x2212;</mml:mo>
<mml:mi>&#x221e;</mml:mi>
</mml:mrow>
<mml:mrow>
<mml:msub>
<mml:mrow>
<mml:mi>E</mml:mi>
</mml:mrow>
<mml:mrow>
<mml:mtext>VBM</mml:mtext>
</mml:mrow>
</mml:msub>
</mml:mrow>
</mml:msubsup>
<mml:msub>
<mml:mrow>
<mml:mi>D</mml:mi>
</mml:mrow>
<mml:mrow>
<mml:mi>V</mml:mi>
</mml:mrow>
</mml:msub>
<mml:mfenced open="(" close=")">
<mml:mrow>
<mml:mi>&#x3f5;</mml:mi>
</mml:mrow>
</mml:mfenced>
<mml:mfenced open="(" close=")">
<mml:mrow>
<mml:mn>1</mml:mn>
<mml:mo>&#x2212;</mml:mo>
<mml:mi>f</mml:mi>
<mml:mfenced open="(" close=")">
<mml:mrow>
<mml:mi>&#x3f5;</mml:mi>
</mml:mrow>
</mml:mfenced>
</mml:mrow>
</mml:mfenced>
<mml:mspace width="0.17em"/>
<mml:mi>d</mml:mi>
<mml:mi>&#x3f5;</mml:mi>
<mml:mspace width="5.0pt"/>
<mml:mo>,</mml:mo>
</mml:mtd>
</mml:mtr>
</mml:mtable>
</mml:math>
<label>(4)</label>
</disp-formula>where <italic>D</italic>
<sub>
<italic>C</italic>
</sub>(<italic>&#x3f5;</italic>), <italic>D</italic>
<sub>
<italic>V</italic>
</sub>(<italic>&#x3f5;</italic>) and <italic>f</italic>(<italic>&#x3f5;</italic>) are the conduction band density of states, valence band density of states, and the Fermi-Dirac distribution function, respectively. For a non-degenerate semiconductor the carrier concentration can be analytically simplified by the parabolic band approximation as<disp-formula id="e5">
<mml:math id="m12">
<mml:mtable class="align" columnalign="left">
<mml:mtr>
<mml:mtd columnalign="right">
<mml:mi>n</mml:mi>
</mml:mtd>
<mml:mtd columnalign="left">
<mml:mo>&#x2248;</mml:mo>
<mml:mn>2</mml:mn>
<mml:msup>
<mml:mrow>
<mml:mfenced open="[" close="]">
<mml:mrow>
<mml:mfrac>
<mml:mrow>
<mml:mn>2</mml:mn>
<mml:mi>&#x3c0;</mml:mi>
<mml:msubsup>
<mml:mrow>
<mml:mi>m</mml:mi>
</mml:mrow>
<mml:mrow>
<mml:mi mathvariant="italic">DOS</mml:mi>
</mml:mrow>
<mml:mrow>
<mml:mo>&#x2217;</mml:mo>
</mml:mrow>
</mml:msubsup>
<mml:msub>
<mml:mrow>
<mml:mi>k</mml:mi>
</mml:mrow>
<mml:mrow>
<mml:mi>B</mml:mi>
</mml:mrow>
</mml:msub>
<mml:mi>T</mml:mi>
</mml:mrow>
<mml:mrow>
<mml:msup>
<mml:mrow>
<mml:mi>h</mml:mi>
</mml:mrow>
<mml:mrow>
<mml:mn>2</mml:mn>
</mml:mrow>
</mml:msup>
</mml:mrow>
</mml:mfrac>
</mml:mrow>
</mml:mfenced>
</mml:mrow>
<mml:mrow>
<mml:mn>3</mml:mn>
<mml:mo>/</mml:mo>
<mml:mn>2</mml:mn>
</mml:mrow>
</mml:msup>
<mml:mo>&#x2061;</mml:mo>
<mml:mi>exp</mml:mi>
<mml:mfenced open="(" close=")">
<mml:mrow>
<mml:mfrac>
<mml:mrow>
<mml:msub>
<mml:mrow>
<mml:mi>E</mml:mi>
</mml:mrow>
<mml:mrow>
<mml:mi mathvariant="normal">F</mml:mi>
</mml:mrow>
</mml:msub>
<mml:mo>&#x2212;</mml:mo>
<mml:msub>
<mml:mrow>
<mml:mi>E</mml:mi>
</mml:mrow>
<mml:mrow>
<mml:mtext>CBM</mml:mtext>
</mml:mrow>
</mml:msub>
</mml:mrow>
<mml:mrow>
<mml:msub>
<mml:mrow>
<mml:mi>k</mml:mi>
</mml:mrow>
<mml:mrow>
<mml:mi>B</mml:mi>
</mml:mrow>
</mml:msub>
<mml:mi>T</mml:mi>
</mml:mrow>
</mml:mfrac>
</mml:mrow>
</mml:mfenced>
<mml:mspace width="5.0pt"/>
<mml:mo>,</mml:mo>
</mml:mtd>
</mml:mtr>
<mml:mtr>
<mml:mtd columnalign="right">
<mml:mi>p</mml:mi>
</mml:mtd>
<mml:mtd columnalign="left">
<mml:mo>&#x2248;</mml:mo>
<mml:mn>2</mml:mn>
<mml:msup>
<mml:mrow>
<mml:mfenced open="[" close="]">
<mml:mrow>
<mml:mfrac>
<mml:mrow>
<mml:mn>2</mml:mn>
<mml:mi>&#x3c0;</mml:mi>
<mml:msubsup>
<mml:mrow>
<mml:mi>m</mml:mi>
</mml:mrow>
<mml:mrow>
<mml:mi mathvariant="italic">DOS</mml:mi>
</mml:mrow>
<mml:mrow>
<mml:mo>&#x2217;</mml:mo>
</mml:mrow>
</mml:msubsup>
<mml:msub>
<mml:mrow>
<mml:mi>k</mml:mi>
</mml:mrow>
<mml:mrow>
<mml:mi>B</mml:mi>
</mml:mrow>
</mml:msub>
<mml:mi>T</mml:mi>
</mml:mrow>
<mml:mrow>
<mml:msup>
<mml:mrow>
<mml:mi>h</mml:mi>
</mml:mrow>
<mml:mrow>
<mml:mn>2</mml:mn>
</mml:mrow>
</mml:msup>
</mml:mrow>
</mml:mfrac>
</mml:mrow>
</mml:mfenced>
</mml:mrow>
<mml:mrow>
<mml:mn>3</mml:mn>
<mml:mo>/</mml:mo>
<mml:mn>2</mml:mn>
</mml:mrow>
</mml:msup>
<mml:mo>&#x2061;</mml:mo>
<mml:mi>exp</mml:mi>
<mml:mfenced open="(" close=")">
<mml:mrow>
<mml:mfrac>
<mml:mrow>
<mml:msub>
<mml:mrow>
<mml:mi>E</mml:mi>
</mml:mrow>
<mml:mrow>
<mml:mtext>VBM</mml:mtext>
</mml:mrow>
</mml:msub>
<mml:mo>&#x2212;</mml:mo>
<mml:msub>
<mml:mrow>
<mml:mi>E</mml:mi>
</mml:mrow>
<mml:mrow>
<mml:mi mathvariant="normal">F</mml:mi>
</mml:mrow>
</mml:msub>
</mml:mrow>
<mml:mrow>
<mml:msub>
<mml:mrow>
<mml:mi>k</mml:mi>
</mml:mrow>
<mml:mrow>
<mml:mi>B</mml:mi>
</mml:mrow>
</mml:msub>
<mml:mi>T</mml:mi>
</mml:mrow>
</mml:mfrac>
</mml:mrow>
</mml:mfenced>
<mml:mspace width="5.0pt"/>
<mml:mo>,</mml:mo>
</mml:mtd>
</mml:mtr>
</mml:mtable>
</mml:math>
<label>(5)</label>
</disp-formula>where <inline-formula id="inf8">
<mml:math id="m13">
<mml:msubsup>
<mml:mrow>
<mml:mi>m</mml:mi>
</mml:mrow>
<mml:mrow>
<mml:mi mathvariant="italic">DOS</mml:mi>
</mml:mrow>
<mml:mrow>
<mml:mo>&#x2a;</mml:mo>
</mml:mrow>
</mml:msubsup>
</mml:math>
</inline-formula> represents DOS effective masses for electrons and holes in the two expressions, respectively. In general, we used <xref ref-type="disp-formula" rid="e5">Eq. 5</xref> to calculate intrinsic carrier concentration using the calculated DOS effective mass for electrons and holes. <xref ref-type="disp-formula" rid="e4">Eq. 4</xref> was used for SnTe and p-type SnS, since we found degenerate doping for these cases (see <xref ref-type="sec" rid="s3-3">Section 3.3</xref>).</p>
</sec>
</sec>
</sec>
<sec sec-type="results|discussion" id="s3">
<title>3 Results and discussion</title>
<sec id="s3-1">
<title>3.1 TE quality factor assessment</title>
<p>To begin, we applied the quality factor approach to SnS, SnSe, and SnTe. The quality factor <italic>&#x3b2;</italic> was evaluated for each material in both the p-type and n-type regime, in order to determine the attainable <italic>zT</italic> and its dependence on carrier concentration. The approach is summarized here for completeness; additional details on the quality factor framework itself can be found in <xref ref-type="bibr" rid="B17">Chasmar and Stratton (1959)</xref> and on the semi-empirical models to obtain needed parameters in <xref ref-type="bibr" rid="B75">Yan et al. (2015)</xref>; <xref ref-type="bibr" rid="B17">Chasmar and Stratton (1959)</xref>.</p>
<p>Within the relaxation time approximation, the solutions to the Boltzmann transport equation offer an expression for <italic>zT</italic> based on material descriptor <italic>&#x3b2;</italic>, as<disp-formula id="e6">
<mml:math id="m14">
<mml:mi>z</mml:mi>
<mml:mi>T</mml:mi>
<mml:mo>&#x3d;</mml:mo>
<mml:mfrac>
<mml:mrow>
<mml:msup>
<mml:mrow>
<mml:mi>&#x3b1;</mml:mi>
</mml:mrow>
<mml:mrow>
<mml:mn>2</mml:mn>
</mml:mrow>
</mml:msup>
<mml:mi>&#x3c3;</mml:mi>
<mml:mi>T</mml:mi>
</mml:mrow>
<mml:mrow>
<mml:msub>
<mml:mrow>
<mml:mi>&#x3ba;</mml:mi>
</mml:mrow>
<mml:mrow>
<mml:mi>L</mml:mi>
</mml:mrow>
</mml:msub>
<mml:mo>&#x2b;</mml:mo>
<mml:msub>
<mml:mrow>
<mml:mi>&#x3ba;</mml:mi>
</mml:mrow>
<mml:mrow>
<mml:mi>e</mml:mi>
</mml:mrow>
</mml:msub>
</mml:mrow>
</mml:mfrac>
<mml:mo>&#x3d;</mml:mo>
<mml:mfrac>
<mml:mrow>
<mml:mi>u</mml:mi>
<mml:mi>&#x3b2;</mml:mi>
</mml:mrow>
<mml:mrow>
<mml:mn>1</mml:mn>
<mml:mo>&#x2b;</mml:mo>
<mml:mi>v</mml:mi>
<mml:mi>&#x3b2;</mml:mi>
</mml:mrow>
</mml:mfrac>
<mml:mspace width="5.0pt"/>
</mml:math>
<label>(6)</label>
</disp-formula>Here, <italic>&#x3b1;</italic>, <italic>&#x3c3;</italic>, <italic>&#x3ba;</italic>
<sub>
<italic>L</italic>
</sub>, and <italic>&#x3ba;</italic>
<sub>
<italic>e</italic>
</sub> are the Seebeck coefficient, electrical conductivity, lattice thermal conductivity, and electrical thermal conductivity, respectively. The functions <italic>u</italic> and <italic>v</italic> are entirely dependent on the reduced Fermi level <italic>&#x3b7;</italic> and charge carrier scattering mechanism <italic>&#x3bd;</italic>, while <italic>&#x3b2;</italic> is an intrinsic material parameter (<xref ref-type="bibr" rid="B17">Chasmar and Stratton (1959)</xref>). From <xref ref-type="fig" rid="F1">Figure 1C</xref>, it is evident that both high <italic>&#x3b2;</italic> and optimized <italic>&#x3b7;</italic> should be concurrently achieved to maximize <italic>zT</italic>. The precise shape of the curve and the optimal carrier concentration depends on the dominant scattering mechanism (e.g. polar optical phonon scattering, impurity scattering, etc).</p>
<p>Non-dimensional parameter <italic>&#x3b2;</italic> involves quantities such as carrier effective mass and &#x201c;intrinsic&#x201d; mobility, band degeneracy, and lattice thermal conductivity. Rigorously <italic>&#x3b2;</italic> is given by <inline-formula id="inf9">
<mml:math id="m15">
<mml:msup>
<mml:mrow>
<mml:mrow>
<mml:mo stretchy="false">(</mml:mo>
<mml:mrow>
<mml:msub>
<mml:mrow>
<mml:mi>k</mml:mi>
</mml:mrow>
<mml:mrow>
<mml:mtext>B</mml:mtext>
</mml:mrow>
</mml:msub>
<mml:mo>/</mml:mo>
<mml:mi>e</mml:mi>
</mml:mrow>
<mml:mo stretchy="false">)</mml:mo>
</mml:mrow>
</mml:mrow>
<mml:mrow>
<mml:mn>2</mml:mn>
</mml:mrow>
</mml:msup>
<mml:mrow>
<mml:mo stretchy="false">(</mml:mo>
<mml:mrow>
<mml:msub>
<mml:mrow>
<mml:mi>&#x3c3;</mml:mi>
</mml:mrow>
<mml:mrow>
<mml:mn>0</mml:mn>
</mml:mrow>
</mml:msub>
<mml:mi>T</mml:mi>
<mml:mo>/</mml:mo>
<mml:msub>
<mml:mrow>
<mml:mi>&#x3ba;</mml:mi>
</mml:mrow>
<mml:mrow>
<mml:mi>L</mml:mi>
</mml:mrow>
</mml:msub>
</mml:mrow>
<mml:mo stretchy="false">)</mml:mo>
</mml:mrow>
</mml:math>
</inline-formula> where <italic>k</italic>
<sub>B</sub> is the Boltzmann constant, <italic>e</italic> the electron charge, <italic>T</italic> the temperature, and <italic>&#x3c3;</italic>
<sub>0</sub> the &#x201c;intrinsic&#x201d; electrical conductivity (<xref ref-type="bibr" rid="B17">Chasmar and Stratton, 1959</xref>; <xref ref-type="bibr" rid="B75">Yan et al., 2015</xref>). The electronic conductivity <italic>&#x3c3;</italic> &#x3d; <italic>&#x3c3;</italic>
<sub>0</sub> exp(<italic>&#x3b7;</italic>), where <italic>&#x3b7;</italic> &#x3d; &#x2212;&#x394;/<italic>k</italic>
<sub>
<italic>b</italic>
</sub>
<italic>T</italic> and &#x394; is the positive distance between the Fermi level and the band edge. The quantity <italic>&#x3c3;</italic>
<sub>0</sub> is determined by the intrinsic mobility <italic>&#x3bc;</italic>
<sub>0</sub> and density of states (DOS) effective mass <inline-formula id="inf10">
<mml:math id="m16">
<mml:msubsup>
<mml:mrow>
<mml:mi>m</mml:mi>
</mml:mrow>
<mml:mrow>
<mml:mi mathvariant="italic">DOS</mml:mi>
</mml:mrow>
<mml:mrow>
<mml:mo>&#x2a;</mml:mo>
</mml:mrow>
</mml:msubsup>
</mml:math>
</inline-formula>. Putting everything together, the expression for <italic>&#x3b2;</italic>(T) is<disp-formula id="e7">
<mml:math id="m17">
<mml:mi>&#x3b2;</mml:mi>
<mml:mfenced open="(" close=")">
<mml:mrow>
<mml:mi>T</mml:mi>
</mml:mrow>
</mml:mfenced>
<mml:mo>&#x3d;</mml:mo>
<mml:mfenced open="(" close=")">
<mml:mrow>
<mml:mn>5.76</mml:mn>
<mml:mo>&#xd7;</mml:mo>
<mml:mn>1</mml:mn>
<mml:msup>
<mml:mrow>
<mml:mn>0</mml:mn>
</mml:mrow>
<mml:mrow>
<mml:mo>&#x2212;</mml:mo>
<mml:mn>6</mml:mn>
</mml:mrow>
</mml:msup>
</mml:mrow>
</mml:mfenced>
<mml:mfrac>
<mml:mrow>
<mml:msub>
<mml:mrow>
<mml:mi>&#x3bc;</mml:mi>
</mml:mrow>
<mml:mrow>
<mml:mn>0</mml:mn>
</mml:mrow>
</mml:msub>
<mml:msup>
<mml:mrow>
<mml:mfenced open="(" close=")">
<mml:mrow>
<mml:msubsup>
<mml:mrow>
<mml:mi>m</mml:mi>
</mml:mrow>
<mml:mrow>
<mml:mi mathvariant="italic">DOS</mml:mi>
</mml:mrow>
<mml:mrow>
<mml:mo>&#x2217;</mml:mo>
</mml:mrow>
</mml:msubsup>
<mml:mo>/</mml:mo>
<mml:msub>
<mml:mrow>
<mml:mi>m</mml:mi>
</mml:mrow>
<mml:mrow>
<mml:mi>e</mml:mi>
</mml:mrow>
</mml:msub>
</mml:mrow>
</mml:mfenced>
</mml:mrow>
<mml:mrow>
<mml:mn>3</mml:mn>
<mml:mo>/</mml:mo>
<mml:mn>2</mml:mn>
</mml:mrow>
</mml:msup>
</mml:mrow>
<mml:mrow>
<mml:msub>
<mml:mrow>
<mml:mi>&#x3ba;</mml:mi>
</mml:mrow>
<mml:mrow>
<mml:mi>L</mml:mi>
</mml:mrow>
</mml:msub>
</mml:mrow>
</mml:mfrac>
<mml:msup>
<mml:mrow>
<mml:mi>T</mml:mi>
</mml:mrow>
<mml:mrow>
<mml:mn>5</mml:mn>
<mml:mo>/</mml:mo>
<mml:mn>2</mml:mn>
</mml:mrow>
</mml:msup>
<mml:mspace width="5.0pt"/>
</mml:math>
<label>(7)</label>
</disp-formula>The intrinsic mobility <italic>&#x3bc;</italic>
<sub>0</sub> and lattice thermal conductivity <italic>&#x3ba;</italic>
<sub>
<italic>L</italic>
</sub> themselves exhibit a temperature dependence, that itself is sensitive to the scattering regime.</p>
<p>To facilitate high-throughput evaluations of <italic>&#x3b2;</italic>, semi-empirical models that predict <italic>&#x3bc;</italic>
<sub>0</sub> and <italic>&#x3ba;</italic>
<sub>
<italic>L</italic>
</sub> at <italic>T</italic> &#x3d; 300&#xa0;K are available (<xref ref-type="bibr" rid="B75">Yan et al., 2015</xref>; <xref ref-type="bibr" rid="B50">Miller et al., 2017</xref>). The model for <italic>&#x3bc;</italic>
<sub>0</sub> accounts for acoustic and optical electron-phonon scattering, and depends on the bulk modulus (<italic>B</italic>) and carrier band effective mass <inline-formula id="inf11">
<mml:math id="m18">
<mml:mrow>
<mml:mo stretchy="false">(</mml:mo>
<mml:mrow>
<mml:msubsup>
<mml:mrow>
<mml:mi>m</mml:mi>
</mml:mrow>
<mml:mrow>
<mml:mi>b</mml:mi>
</mml:mrow>
<mml:mrow>
<mml:mo>&#x2a;</mml:mo>
</mml:mrow>
</mml:msubsup>
</mml:mrow>
<mml:mo stretchy="false">)</mml:mo>
</mml:mrow>
</mml:math>
</inline-formula>. Typically, this model predicts mobilities that lie within a factor of ten of experiment across a diverse set of materials with mobilities spanning several orders of magnitude (<xref ref-type="bibr" rid="B75">Yan et al., 2015</xref>). The model for <italic>&#x3ba;</italic>
<sub>
<italic>L</italic>
</sub> includes contributions from acoustic and optical phonon modes and depends on the material density and speed of sound. This model has been extended to better capture anharmonicity, resulting in accurate predictions of <italic>&#x3ba;</italic>
<sub>L</sub> at 300&#xa0;K for a range of materials (<xref ref-type="bibr" rid="B50">Miller et al., 2017</xref>). We also note that the semi empirical models used here do not explicitly account for anisotropy, but estimate average values, which may contribute to uncertainties in computed properties.</p>
<p>
<xref ref-type="table" rid="T1">Table 1</xref> reports the value of <italic>&#x3b2;</italic> we obtained for SnS, SnSe, and SnTe. The classic TE material PbTe is also shown for reference. For each material, the value of <italic>&#x3b2;</italic> is shown for the principal crystal structure(s) in which it is observed. SnS and SnSe are stable in layered orthorhombic <italic>Pnma</italic> crystal structure, a distorted version of rock salt (<xref ref-type="fig" rid="F2">Figure 2A</xref>), at room temperature. Although both SnS and SnSe undergo a phase transition around 950&#xa0;K and 750&#x2013;800&#xa0;K from <italic>Pnma</italic> to <italic>Cmcm</italic> crystal structure (<xref ref-type="fig" rid="F2">Figure 2B</xref>), in <xref ref-type="table" rid="T1">Table 1</xref> we considered only the <italic>Cmcm</italic> phase for SnSe as the transition temperature for SnS is quite high. In the <italic>Cmcm</italic> structure, the crystallographic orientation of Sn and Se atoms is altered so that Sn cations are bonded to five equivalent anions and form a mixture of corner and edge-sharing square pyramids. On the other hand, SnTe is stable in the cubic rock salt structure, where each Sn is bonded with six Te atoms forming edge and corner-sharing symmetric octahedral bonds as shown in <xref ref-type="fig" rid="F2">Figure 2C</xref>.</p>
<table-wrap id="T1" position="float">
<label>TABLE 1</label>
<caption>
<p>Computed transport properties and thermoelectric quality factor <italic>&#x3b2;</italic> at 300&#xa0;K for SnS, SnSe, and SnTe obtained from semi-empirical models (Yan et al., 2015; Miller et al. 2017). For each Sn chalcogenide, <italic>&#x3b2;</italic> is normalized to the corresponding value for p-type PbTe (44.15). For p-type materials, SnSe (<italic>Cmcm</italic>) and SnTe have TE quality factor exceeding that of p-type PbTe; for n-type materials only SnSe (<italic>Pnma</italic>) has TE quality factor exceeding p-type PbTe.</p>
</caption>
<table>
<thead valign="top">
<tr>
<th rowspan="2" align="left">Phases</th>
<th rowspan="2" align="left">Space group</th>
<th rowspan="2" align="left">
<italic>&#x3b2;</italic>
<sub>p</sub>/<italic>&#x3b2;</italic>
<sub>PbTe</sub>
</th>
<th rowspan="2" align="left">
<italic>&#x3b2;</italic>
<sub>n</sub>/<italic>&#x3b2;</italic>
<sub>PbTe</sub>
</th>
<th rowspan="2" align="left">
<inline-formula id="inf12">
<mml:math id="m19">
<mml:msubsup>
<mml:mrow>
<mml:mi>m</mml:mi>
</mml:mrow>
<mml:mrow>
<mml:mtext>DOS,VB</mml:mtext>
</mml:mrow>
<mml:mrow>
<mml:mo>&#x2a;</mml:mo>
</mml:mrow>
</mml:msubsup>
</mml:math>
</inline-formula>
</th>
<th rowspan="2" align="left">
<inline-formula id="inf13">
<mml:math id="m20">
<mml:msubsup>
<mml:mrow>
<mml:mi>m</mml:mi>
</mml:mrow>
<mml:mrow>
<mml:mtext>DOS,CB</mml:mtext>
</mml:mrow>
<mml:mrow>
<mml:mo>&#x2a;</mml:mo>
</mml:mrow>
</mml:msubsup>
</mml:math>
</inline-formula>
</th>
<th rowspan="2" align="left">
<italic>N</italic>
<sub>b,VB</sub>
</th>
<th rowspan="2" align="left">
<italic>N</italic>
<sub>b,CB</sub>
</th>
<th align="left">B</th>
<th align="left">
<italic>&#x3ba;</italic>
<sub>L</sub>
</th>
<th align="left">
<italic>&#x3bc;</italic>
<sub>p</sub>
</th>
<th align="left">
<italic>&#x3bc;</italic>
<sub>n</sub>
</th>
</tr>
<tr>
<th align="left">(GPa)</th>
<th align="left">(W/mK)</th>
<th align="left">(cm<sup>2</sup>/Vs)</th>
<th align="left">(cm<sup>2</sup>/Vs)</th>
</tr>
</thead>
<tbody valign="top">
<tr>
<td align="left">SnS</td>
<td align="left">
<italic>Pnma</italic>
</td>
<td align="left">0.32</td>
<td align="left">0.27</td>
<td align="left">1.58</td>
<td align="left">0.4</td>
<td align="left">4</td>
<td align="left">2</td>
<td align="left">29</td>
<td align="left">1.32</td>
<td align="left">7</td>
<td align="left">28</td>
</tr>
<tr>
<td align="left">SnSe</td>
<td align="left">
<italic>Pnma</italic>
</td>
<td align="left">0.51</td>
<td align="left">
<bold>1.16</bold>
</td>
<td align="left">0.81</td>
<td align="left">0.35</td>
<td align="left">4</td>
<td align="left">5</td>
<td align="left">23</td>
<td align="left">0.97</td>
<td align="left">15</td>
<td align="left">67</td>
</tr>
<tr>
<td align="left">SnSe</td>
<td align="left">
<italic>Cmcm</italic>
</td>
<td align="left">
<bold>1.04</bold>
</td>
<td align="left">0.27</td>
<td align="left">0.25</td>
<td align="left">0.46</td>
<td align="left">4</td>
<td align="left">2</td>
<td align="left">23</td>
<td align="left">0.95</td>
<td align="left">87</td>
<td align="left">17</td>
</tr>
<tr>
<td align="left">SnTe</td>
<td align="left">
<italic>Fm3m</italic>
</td>
<td align="left">
<bold>1.34</bold>
</td>
<td align="left">0.73</td>
<td align="left">0.07</td>
<td align="left">0.19</td>
<td align="left">4</td>
<td align="left">4</td>
<td align="left">40</td>
<td align="left">2.79</td>
<td align="left">1,036</td>
<td align="left">232</td>
</tr>
<tr>
<td align="left">PbTe</td>
<td align="left">
<italic>Fm3m</italic>
</td>
<td align="left">
<bold>1.00</bold>
</td>
<td align="left">
<bold>1.45</bold>
</td>
<td align="left">0.17</td>
<td align="left">0.09</td>
<td align="left">4</td>
<td align="left">4</td>
<td align="left">39</td>
<td align="left">2.14</td>
<td align="left">267</td>
<td align="left">699</td>
</tr>
</tbody>
</table>
<table-wrap-foot>
<fn>
<p>Materials for which the TE quality factor exceeds that of p-type PbTe are indicated in bold.</p>
</fn>
</table-wrap-foot>
</table-wrap>
<fig id="F2" position="float">
<label>FIGURE 2</label>
<caption>
<p>
<bold>(A)</bold> SnS and SnSe form in layered orthorhombic crystal structure <italic>Pnma</italic> at room temperature. Sn (blue) and S, Se (green) atoms are connected with strong Sn-S, Sn-Se bonds in the plane and weak bonds normal to the plane (a-direction). <bold>(B)</bold> High-temperature phase for SnS (&#x223c;950&#xa0;K) and SnSe (&#x223c;800&#xa0;K) in the orthorhombic crystal structure in higher symmetry <italic>Cmcm</italic> space group. <bold>(C)</bold> SnTe crystallizes in the rock salt phase where each Sn (blue) is bonded with six Te (gold) atoms forming symmetric octahedral bonds.</p>
</caption>
<graphic xlink:href="femat-02-1059684-g002.tif"/>
</fig>
<p>The predicted <italic>&#x3b2;</italic> and associated parameters that we obtained are summarized in <xref ref-type="table" rid="T1">Table 1</xref>. The values reported here are updated from those in <xref ref-type="bibr" rid="B75">Yan et al. (2015)</xref> due to the inclusion of spin-orbit coupling and the improved thermal conductivity model (<xref ref-type="bibr" rid="B50">Miller et al., 2017</xref>). For each material we show the quality factor normalized by the corresponding value in p-type PbTe, for both p-type (<italic>&#x3b2;</italic>
<sub>p</sub>/<italic>&#x3b2;</italic>
<sub>PbTe,p</sub>) and n-type (<italic>&#x3b2;</italic>
<sub>n</sub>/<italic>&#x3b2;</italic>
<sub>PbTe,p</sub>) carriers.</p>
<p>Focusing on p-type performance, from <xref ref-type="table" rid="T1">Table 1</xref>, both SnSe (<italic>Cmcm</italic>) and SnTe have higher <italic>&#x3b2;</italic>
<sub>p</sub> than PbTe. The large <italic>&#x3b2;</italic>
<sub>p</sub> for SnSe is expected; experimentally, p-type SnSe exhibits the highest reported <italic>zT</italic> amongst all single crystal materials (<xref ref-type="bibr" rid="B78">Zhao et al., 2014</xref>). On the other hand, SnTe does show reasonable <italic>zT</italic> experimentally, but larger values are only achieved when alloyed (<xref ref-type="bibr" rid="B5">Al Rahal Al Orabi et al., 2016</xref>; <xref ref-type="bibr" rid="B21">Doi et al., 2019</xref>; <xref ref-type="bibr" rid="B45">Ma et al., 2019</xref>; <xref ref-type="bibr" rid="B71">Tang et al., 2018</xref>; <xref ref-type="bibr" rid="B69">Tan et al., 2015</xref>). The <italic>Cmcm</italic> phase of SnSe shows higher <italic>&#x3b2;</italic>
<sub>p</sub> than the <italic>Pnma</italic> phase, consistent with the experimentally reported higher <italic>zT</italic>s (<xref ref-type="bibr" rid="B78">Zhao et al., 2014</xref>; <xref ref-type="bibr" rid="B57">Qin et al., 2018</xref>; <xref ref-type="bibr" rid="B79">Zhao et al., 2015</xref>; <xref ref-type="bibr" rid="B18">Chere et al., 2016</xref>). The larger <italic>&#x3b2;</italic>
<sub>p</sub> for <italic>Cmcm</italic> arises from the higher hole mobility and comparable lattice thermal conductivity to the <italic>Pnma</italic> phase; the higher hole mobility in turn arises from a lower band effective mass. Similarly, we obtained good <italic>&#x3b2;</italic>
<sub>p</sub> for SnTe due to very low valence band effective mass resulting in high mobility. Although we predicted <italic>&#x3b2;</italic>
<sub>p</sub> to be low in SnS, recent experiments have shown that a <italic>zT</italic> of 1.6 is achievable in <italic>p</italic>-type SnS when alloyed with Se (<xref ref-type="bibr" rid="B33">He et al., 2019</xref>).</p>
<p>For n-type performance indicator <italic>&#x3b2;</italic>
<sub>n</sub>, we predict the highest performance again for SnSe, but now in the low symmetry <italic>Pnma</italic> phase due to high band degeneracy in the conduction band and high mobility which also matches previous computational analysis on SnSe (<xref ref-type="bibr" rid="B39">Kutorasinski et al., 2015</xref>). Experiments also support this prediction, as almost all n-type reports of high <italic>zT</italic> in SnSe are in the <italic>Pnma</italic> phase (<xref ref-type="bibr" rid="B77">Zhang et al., 2015</xref>; <xref ref-type="bibr" rid="B22">Duong et al., 2016</xref>; <xref ref-type="bibr" rid="B16">Chang et al., 2016</xref>; <xref ref-type="bibr" rid="B64">Shang et al., 2019</xref>; <xref ref-type="bibr" rid="B14">Cha et al., 2019</xref>; <xref ref-type="bibr" rid="B12">Cai J et al., 2020</xref>; <xref ref-type="bibr" rid="B32">Gu et al., 2021</xref>). Meanwhile the n-type ratio <italic>&#x3b2;</italic>
<sub>n</sub>/<italic>&#x3b2;</italic>
<sub>PbTe,p</sub> is 0.73 for SnTe, and is only 0.27 for SnS. There are no reports of n-type SnTe unless heavily alloyed with PbTe (<xref ref-type="bibr" rid="B53">Pang et al., 2021</xref>), and very few reports of n-type SnS (<xref ref-type="bibr" rid="B80">Zhi-Cheng et al., 2019</xref>; <xref ref-type="bibr" rid="B34">Hu et al., 2019</xref>).</p>
</sec>
<sec id="s3-2">
<title>3.2 <italic>zT</italic> vs carrier concentration: Computation and experiments</title>
<p>We next used the computed values of <italic>&#x3b2;</italic> to predict the carrier concentration dependence of <italic>zT</italic> for each material. <xref ref-type="fig" rid="F3">Figures 3</xref>, <xref ref-type="fig" rid="F4">4</xref> show the carrier concentration dependence for p-type and n-type materials respectively, which are compared to previous experimentally reported values we obtained from literature. Since the predicted values of <italic>&#x3b2;</italic> in <xref ref-type="table" rid="T1">Table 1</xref> are valid for 300&#xa0;K, to make each curve we used <xref ref-type="disp-formula" rid="e7">Eq. 7</xref> to estimate the corresponding value for <italic>&#x3b2;</italic> at 900&#xa0;K for SnS (<italic>Pnma</italic>) and SnTe (rock salt) and 800&#xa0;K for SnSe (<italic>Pnma</italic> and <italic>Cmcm</italic>) phases, which are more typical of the temperatures at which <italic>zT</italic> has been reported. The predicted <italic>zT</italic> at different temperatures are also shown in <xref ref-type="sec" rid="s10">Supplementary Figures S2, S3</xref>.</p>
<fig id="F3" position="float">
<label>FIGURE 3</label>
<caption>
<p>Prediction of zT for p-type <bold>(A)</bold> SnS (<italic>Pnma</italic>), <bold>(B)</bold> SnSe (<italic>Pnm</italic>a), <bold>(C)</bold> SnSe (<italic>Cmcm</italic>), and <bold>(D)</bold> SnTe (rock salt). The red and blue lines show <italic>zT</italic> for polar optical phonon and ionized impurity limited carrier mobility, respectively. The shaded region accounts for the uncertainty in the predicted mobility <italic>&#x3bc;</italic>
<sub>0</sub>. The largest experimentally reported <italic>zT</italic>s for both doped (green dots) and alloyed compositions (green asterisks) are shown for comparison (<xref ref-type="bibr" rid="B81">Zhou et al., 2017</xref>; <xref ref-type="bibr" rid="B70">Tan et al., 2014</xref>; <xref ref-type="bibr" rid="B33">He et al., 2019</xref>; <xref ref-type="bibr" rid="B11">Cai B et al., 2020</xref>; <xref ref-type="bibr" rid="B78">Zhao et al., 2014</xref>; <xref ref-type="bibr" rid="B79">2015</xref>; <xref ref-type="bibr" rid="B57">Qin et al., 2018</xref>; <xref ref-type="bibr" rid="B18">Chere et al., 2016</xref>; <xref ref-type="bibr" rid="B5">Al Rahal Al Orabi et al., 2016</xref>; <xref ref-type="bibr" rid="B21">Doi et al., 2019</xref>; <xref ref-type="bibr" rid="B45">Ma et al., 2019</xref>; <xref ref-type="bibr" rid="B71">Tang et al., 2018</xref>; <xref ref-type="bibr" rid="B69">Tan et al., 2015</xref>).</p>
</caption>
<graphic xlink:href="femat-02-1059684-g003.tif"/>
</fig>
<fig id="F4" position="float">
<label>FIGURE 4</label>
<caption>
<p>Prediction of zT for n-type <bold>(A)</bold> SnS (<italic>Pnma</italic>), <bold>(B)</bold> SnSe (<italic>Pnma</italic>), <bold>(C)</bold> SnSe (<italic>Cmcm</italic>), and <bold>(D)</bold> SnTe (rock salt). The shaded region accounts for the uncertainty in the predicted mobility <italic>&#x3bc;</italic>
<sub>0</sub>. The largest experimentally reported <italic>zT</italic>s for both doped (orange dots) and alloyed compositions (orange asterisks) are shown for comparison (<xref ref-type="bibr" rid="B80">Zhi-Cheng et al., 2019</xref>; <xref ref-type="bibr" rid="B34">Hu et al., 2019</xref>; <xref ref-type="bibr" rid="B77">Zhang et al., 2015</xref>; <xref ref-type="bibr" rid="B22">Duong et al., 2016</xref>; <xref ref-type="bibr" rid="B16">Chang et al., 2016</xref>; <xref ref-type="bibr" rid="B64">Shang et al., 2019</xref>; <xref ref-type="bibr" rid="B14">Cha et al., 2019</xref>; <xref ref-type="bibr" rid="B12">Cai J et al., 2020</xref>; <xref ref-type="bibr" rid="B32">Gu et al., 2021</xref>; <xref ref-type="bibr" rid="B53">Pang et al., 2021</xref>). Compared to <italic>p</italic>-type, there are fewer experimental reports for <italic>n</italic>-type Sn chalcogenides.</p>
</caption>
<graphic xlink:href="femat-02-1059684-g004.tif"/>
</fig>
<p>To extrapolate <italic>&#x3b2;</italic> to these higher temperatures, we assumed that the ratio of the mobility <italic>&#x3bc;</italic>
<sub>0</sub> to the lattice thermal conductivity <italic>&#x3ba;</italic>
<sub>
<italic>L</italic>
</sub> remains constant. In <xref ref-type="fig" rid="F3">Figures 3</xref>, <xref ref-type="fig" rid="F4">4</xref>, dots indicate reported <italic>zT</italic> for doped materials, while asterisks are used to denote prior measurements for alloyed systems. Doping typically refers to the controlled addition of a small quantity of impurities to adjust electrical properties, whereas alloying is the formation of a solid solution; here the &#x2018;doped&#x2019; and &#x2018;alloyed&#x2019; labels are assigned based on the original authors&#x2019; classification.</p>
<p>Predicted <italic>zT</italic> in the p-type Sn chalcogenides is shown in <xref ref-type="fig" rid="F3">Figure 3</xref>. The red line shows the dependence of <italic>zT</italic> on carrier concentration for the case of polar optical phonon limited carrier mobility, while the blue line corresponds to impurity scattering limited mobility. Both of these regimes are shown since, although polar optical phonon scattering has been predicted to be the dominant bulk scattering mechanism in most binary chalcogenides (<xref ref-type="bibr" rid="B28">Ganose et al., 2021</xref>), impurity scattering can also dominate when doping levels are substantial. Each line also contains a shaded region around it, corresponding to a factor of ten uncertainty in the semi-empirical model for carrier mobility.</p>
<p>For both <italic>Pnma</italic> and <italic>Cmcm</italic> SnSe, the computational predictions are in good agreement with experiment (<xref ref-type="fig" rid="F3">Figures 3B,C</xref>). This comparison also shows that the predicted high <italic>zT</italic> has been achieved experimentally (<xref ref-type="bibr" rid="B78">Zhao et al., 2014</xref>; <xref ref-type="bibr" rid="B57">Qin et al., 2018</xref>; <xref ref-type="bibr" rid="B79">Zhao et al., 2015</xref>; <xref ref-type="bibr" rid="B18">Chere et al., 2016</xref>) for p-type SnSe. On the other hand for SnS and SnTe, there is more discrepancy between the model predictions and experiment. These discrepancies likely arise 1) from uncertainties in the model and computed parameters, and 2) because many of the experimentally reported values correspond to alloys (especially for SnTe). In spite of these differences, from <xref ref-type="fig" rid="F3">Figure 3A</xref> it appears that higher <italic>zT</italic> may be possible for SnS if the hole carrier concentration could be increased beyond typical values (<xref ref-type="bibr" rid="B81">Zhou et al., 2017</xref>; <xref ref-type="bibr" rid="B70">Tan et al., 2014</xref>; <xref ref-type="bibr" rid="B33">He et al., 2019</xref>; <xref ref-type="bibr" rid="B11">Cai B et al., 2020</xref>) of 10<sup>18</sup>&#x2013;10<sup>19</sup>&#xa0;cm<sup>&#x2212;3</sup>. For p-type SnTe <xref ref-type="fig" rid="F3">Figure 3D</xref> suggests the opposite: that even higher <italic>zT</italic> could be achieved if hole concentrations could be reduced below typical values (<xref ref-type="bibr" rid="B5">Al Rahal Al Orabi et al., 2016</xref>; <xref ref-type="bibr" rid="B21">Doi et al., 2019</xref>; <xref ref-type="bibr" rid="B45">Ma et al., 2019</xref>; <xref ref-type="bibr" rid="B71">Tang et al., 2018</xref>; <xref ref-type="bibr" rid="B69">Tan et al., 2015</xref>) of <inline-formula id="inf14">
<mml:math id="m21">
<mml:mo>&#x223c;</mml:mo>
<mml:mn>1</mml:mn>
<mml:msup>
<mml:mrow>
<mml:mn>0</mml:mn>
</mml:mrow>
<mml:mrow>
<mml:mn>20</mml:mn>
</mml:mrow>
</mml:msup>
</mml:math>
</inline-formula> cm<sup>&#x2212;3</sup>).</p>
<p>Similarly, predicted <italic>zT</italic> for n-type Sn chalcogenides is shown in <xref ref-type="fig" rid="F4">Figure 4</xref>. Compared to p-type counterparts, there are fewer experimental measurements of n-type SnS and SnSe (<italic>Pnma</italic>), and no n-type performance has been reported for either SnSe (<italic>Cmcm</italic>) or SnTe (unless heavily alloyed with PbTe <xref ref-type="bibr" rid="B53">Pang et al. (2021)</xref>). For SnS (<xref ref-type="fig" rid="F4">Figure 4A</xref>), only two experimental measurements (<xref ref-type="bibr" rid="B80">Zhi-Cheng et al., 2019</xref>; <xref ref-type="bibr" rid="B34">Hu et al., 2019</xref>) are available, showing <italic>zT</italic> &#x3d; 0.12 and <italic>zT</italic> &#x3d; 0.17 (the dots in <xref ref-type="fig" rid="F4">Figure 4A</xref> overlap). Here, the predictions indicate that higher <italic>zT</italic> could be achieved by increasing the electron carrier concentration. For SnSe (<italic>Pnma</italic>), reasonable n-type <italic>zT</italic>s have been reported. Within the uncertainty of the computational predictions, slight improvements may be possible with further carrier concentration tuning (<xref ref-type="fig" rid="F4">Figure 4B</xref>). The predicted n-type performance of the <italic>Cmcm</italic> phase of SnSe is quite low compared to the <italic>Pnma</italic> phase (<xref ref-type="fig" rid="F4">Figure 4C</xref>). For SnTe, although the inability to achieve n-type material is well-known it is interesting to note that the model predicts that for electron carrier concentrations on the order of <inline-formula id="inf15">
<mml:math id="m22">
<mml:mo>&#x223c;</mml:mo>
<mml:mn>1</mml:mn>
<mml:msup>
<mml:mrow>
<mml:mn>0</mml:mn>
</mml:mrow>
<mml:mrow>
<mml:mn>19</mml:mn>
</mml:mrow>
</mml:msup>
</mml:math>
</inline-formula> cm<sup>&#x2212;3</sup>, <italic>zT</italic> &#x2248; 1.5 could be achievable (<xref ref-type="fig" rid="F4">Figure 4D</xref>).</p>
<p>We note that the required carrier concentration to achieve maximum <italic>zT</italic> depends on the <italic>&#x3b2;</italic> of each material, which in turn arises from the material&#x2019;s electronic structure. Starting with p-type compounds, SnS has a comparatively low <italic>&#x3b2;</italic>, therefore to reach its maximum zT high hole carrier concentration on the order of 10<sup>20</sup>&#x2013;10<sup>21</sup>&#xa0;cm<sup>&#x2212;3</sup> is required. For p-type SnSe in the <italic>Pnma</italic> phase, <italic>&#x3b2;</italic> is higher than p-type SnS, so the required hole carrier concentration is on the order of <inline-formula id="inf16">
<mml:math id="m23">
<mml:mo>&#x223c;</mml:mo>
<mml:mn>1</mml:mn>
<mml:msup>
<mml:mrow>
<mml:mn>0</mml:mn>
</mml:mrow>
<mml:mrow>
<mml:mn>20</mml:mn>
</mml:mrow>
</mml:msup>
</mml:math>
</inline-formula> cm<sup>&#x2212;3</sup>. SnSe in the <italic>Cmcm</italic> phase and SnTe have high <italic>&#x3b2;</italic> and so, the maximum TE potential can be achieved around lower carrier concentrations of 10<sup>19</sup>&#xa0;cm<sup>&#x2212;3</sup> and 10<sup>18</sup>&#xa0;cm<sup>&#x2212;3</sup> respectively for SnSe (<italic>Cmcm</italic>) and SnTe. Our prediction for p-type SnSe matches previous computational analysis that good p-type performance might be achievable when the carrier concentration is on the order of 10<sup>19</sup>&#x2013;10<sup>20</sup>&#xa0;cm<sup>&#x2212;3</sup> (<xref ref-type="bibr" rid="B65">Shi and Kioupakis, 2015</xref>). In the n-type cases, we again observe similar behavior. For SnS and SnSe (<italic>Cmcm</italic>) phase <italic>&#x3b2;</italic> is low, so the required carrier concentration is between 5 &#xd7; 10<sup>19</sup>&#x2013;10<sup>20</sup>&#xa0;cm<sup>&#x2212;3</sup>. However, for SnSe (<italic>Pnma</italic>) and SnTe we find that a carrier concentration of 10<sup>19</sup>&#xa0;cm<sup>&#x2212;3</sup> would be sufficient for achieving the maximum TE potential. Therefore, our analysis reflects that if a material has high <italic>&#x3b2;</italic> then the required carrier concentration e.g. doping level would be lower than a material with low <italic>&#x3b2;</italic>.</p>
<p>However, as shown by the shaded curves in <xref ref-type="fig" rid="F3">Figures 3</xref>, <xref ref-type="fig" rid="F4">4</xref>, there are uncertainties in the semi-empirical models used to estimate mobilities and lattice thermal conductivity, and therefore quality factor <italic>&#x3b2;</italic>. The evaluated mobilities introduce a particularly large uncertainty, as they may vary by an order of magnitude from experimentally measured ones. For instance, the predicted hole mobilities for SnS, SnSe, and SnTe are around 7, 15, and 1,000&#xa0;cm<sup>2</sup>/(<italic>Vs</italic>) while the experimental hole mobilities are 80, 170, and 650&#xa0;cm<sup>2</sup>/(<italic>Vs</italic>) at 300&#xa0;K (<xref ref-type="bibr" rid="B5">Al Rahal Al Orabi et al., 2016</xref>; <xref ref-type="bibr" rid="B28">Ganose et al., 2021</xref>). The discrepancies arise from the empirical nature of the scattering models and the neglect of the role of defects themselves when estimating mobility. One effective approach to overcome the uncertainty of the predicted mobility would be to obtain the mobility from readily available experimental data instead, using the concept of the &#x201c;weighted mobility&#x201d; <italic>&#x3bc;</italic>
<sub>
<italic>w</italic>
</sub> (<xref ref-type="bibr" rid="B66">Snyder et al., 2020</xref>). The weighted mobility can be obtained from measurements of the Seebeck coefficient and electrical resistivity, and is related to the drift mobility by <inline-formula id="inf17">
<mml:math id="m24">
<mml:msub>
<mml:mrow>
<mml:mi>&#x3bc;</mml:mi>
</mml:mrow>
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<mml:mn>2</mml:mn>
</mml:mrow>
</mml:msup>
</mml:math>
</inline-formula>. These experimentally-obtained values can instead be used to estimate the quality factor at specific temperatures of interest, so that <xref ref-type="disp-formula" rid="e7">Eq. 7</xref> becomes<disp-formula id="e8">
<mml:math id="m25">
<mml:mi>&#x3b2;</mml:mi>
<mml:mfenced open="(" close=")">
<mml:mrow>
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<label>(8)</label>
</disp-formula>
</p>
<p>From here, target carrier concentrations can again be identified for maximum thermoelectric performance.</p>
<p>In summary, by optimizing carrier concentration improvements may be possible in p-type SnS and SnTe, and n-type SnS, SnSe (<italic>Pnma</italic>), and SnTe. Meanwhile the p-type performance observed in SnSe appears to be close to its peak predicted value. However, realizing improved performance relies on the ability to tune carrier concentrations, which in turn depends on native defects and dopability. To assess the possibility of achieving the target carrier concentrations, in the next section we analyze the dopability of SnS, SnTe, and SnSe (<italic>Pnma</italic>).</p>
</sec>
<sec id="s3-3">
<title>3.3 Dopability predictions</title>
<sec id="s3-3-1">
<title>3.3.1 Phase stability</title>
<p>The first step for dopability analysis is to establish the phase stability limits of SnS (<italic>Pnma</italic>), SnSe (<italic>Pnma</italic>), and SnTe (<italic>Fm3m</italic>). Thermodynamic stability is set by an allowable range of chemical potentials &#x394;<italic>&#x3bc;</italic>
<sub>
<italic>i</italic>
</sub>(T, P) that give the availability of each element <italic>i</italic>, with more (or less) negative values indicating relative scarcity (or abundance) in the thermodynamic environment. Outside of this range, the compound becomes unstable with respect to the formation of competing boundary phases. Beyond determining stability limits, by controlling chemical potentials during growth it is possible to tune defect concentrations and gain better control over both carrier type and quantity, dopability, and transport (<xref ref-type="bibr" rid="B51">Ohno et al., 2018</xref>; <xref ref-type="bibr" rid="B49">Male et al., 2019</xref>; <xref ref-type="bibr" rid="B52">Ortiz et al., 2019</xref>).</p>
<p>The chemical potential stability regions of SnS, SnSe and SnTe are indicated by the teal lines in <xref ref-type="fig" rid="F5">Figure 5</xref>, as a function of the chemical potential &#x394;<italic>&#x3bc;</italic>
<sub>Sn</sub>. For binary Sn compounds, fixing the chemical potential &#x394;&#x3bc;<sub>Sn</sub> correspondingly fixes the chemical potential of the remaining element. For SnS for instance<disp-formula id="e9">
<mml:math id="m26">
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<mml:mrow>
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<mml:mi mathvariant="normal">n</mml:mi>
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</mml:mrow>
</mml:mfenced>
<mml:mspace width="5.0pt"/>
<mml:mo>,</mml:mo>
</mml:math>
<label>(9)</label>
</disp-formula>where &#x394;<italic>H</italic>
<sub>
<italic>f</italic>
</sub>(SnS) is the enthalpy of formation of SnS. The stability region for each compound is therefore shown as a one-dimensional line in <xref ref-type="fig" rid="F5">Figure 5</xref> that spans the allowed range of Sn-poor to Sn-rich conditions. The line is bounded on both ends by &#x201c;invariant points,&#x201d; fixed points that correspond to two-phase equilibria between the compound of interest and a second, competing phase. The competing boundary phases that limit the stability of SnS are elemental Sn (under Sn-rich conditions) and SnS<sub>2</sub> (under S-rich conditions). Elemental Sn and SnSe<sub>2</sub> limit the stability of SnSe for Sn-rich and Se-rich conditions, respectively. For SnTe, the stability region is bounded by Sn and Te for Sn-rich and Te-rich conditions respectively, as there are no other competing phases in the Sn-Te binary phase diagram.</p>
<fig id="F5" position="float">
<label>FIGURE 5</label>
<caption>
<p>Phase stability regions for Orthorhombic <bold>(A)</bold> SnS (<italic>Pnma</italic>), <bold>(B)</bold> SnSe (<italic>Pnma</italic>) and rock salt <bold>(C)</bold> SnTe (<italic>Fm3m</italic>) in chemical potential space (shaded teal region) with the limiting phases denoted (black circles).</p>
</caption>
<graphic xlink:href="femat-02-1059684-g005.tif"/>
</fig>
<p>We found formation energies from DFT-HSE for SnS, SnSe, and SnTe to be &#x394;<italic>H</italic>
<sub>
<italic>f</italic>
</sub> &#x3d; &#x2212;0.43, &#x2212;0.44, and &#x2212;0.28&#xa0;eV per atom, while the reported experimental formation energies are &#x394;<italic>H</italic>
<sub>
<italic>f</italic>
</sub> &#x3d; &#x2212;0.57, &#x2212;0.47, and &#x2212;0.32&#xa0;eV per atom (<xref ref-type="bibr" rid="B68">Stevanovi&#x107; et al., 2012</xref>; <xref ref-type="bibr" rid="B13">Castanet et al., 1972</xref>). The difference between DFT-HSE and experimental reports is within 0.14&#xa0;eV/atom for all three compounds, which is within the expected range of DFT uncertainties (<xref ref-type="bibr" rid="B68">Stevanovi&#x107; et al., 2012</xref>; <xref ref-type="bibr" rid="B36">Kim et al., 2016</xref>). Considering the competing phases of all three compounds the chemical potential boundaries are &#x2212;0.43&#xa0;eV <inline-formula id="inf18">
<mml:math id="m27">
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</mml:mrow>
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<mml:mtext>Sn</mml:mtext>
</mml:mrow>
</mml:msub>
<mml:mo>&#x2264;</mml:mo>
</mml:math>
</inline-formula> 0&#xa0;eV, &#x2212;0.60&#xa0;eV <inline-formula id="inf19">
<mml:math id="m28">
<mml:mo>&#x2264;</mml:mo>
<mml:mi mathvariant="normal">&#x394;</mml:mi>
<mml:msub>
<mml:mrow>
<mml:mi>&#x3bc;</mml:mi>
</mml:mrow>
<mml:mrow>
<mml:mtext>Sn</mml:mtext>
</mml:mrow>
</mml:msub>
<mml:mo>&#x2264;</mml:mo>
</mml:math>
</inline-formula> 0&#xa0;eV and &#x2212;0.55&#xa0;eV <inline-formula id="inf20">
<mml:math id="m29">
<mml:mo>&#x2264;</mml:mo>
<mml:mi mathvariant="normal">&#x394;</mml:mi>
<mml:msub>
<mml:mrow>
<mml:mi>&#x3bc;</mml:mi>
</mml:mrow>
<mml:mrow>
<mml:mtext>Sn</mml:mtext>
</mml:mrow>
</mml:msub>
<mml:mo>&#x2264;</mml:mo>
</mml:math>
</inline-formula> 0&#xa0;eV for SnS, SnSe and SnTe respectively ranging from Sn-poor to Sn-rich growth conditions (<xref ref-type="fig" rid="F5">Figure 5</xref>). This accessible range of chemical potentials from Sn-poor to Sn-rich growth conditions leads to variations in defect and carrier concentrations and establishes the dopability window for each compound, as described below.</p>
</sec>
</sec>
<sec id="s3-4">
<title>3.3.2 Approach to dopability prediction</title>
<p>We next analyzed the defect chemistry and dopability of all three compounds to determine if the optimal carrier concentrations we identified in <xref ref-type="sec" rid="s3-2">Section 3.2</xref> are accessible <italic>via</italic> control over defects. The dopability window of a compound is established from the formation energies of native defects at each of the two invariant points of the stability region. For the binary Sn chalcogenides, Sn-poor conditions are most favorable for acceptor Sn vacancies V<sub>Sn</sub> to form and therefore represent conditions that promote larger p-type carrier concentrations. In contrast, Sn-rich (anion-poor) conditions are most favorable for anion donor vacancies to form, and therefore most suitable when trying to achieve large n-type carrier concentration. By investigating defect formation at these two extremes, the complete accessible range of carrier concentrations under equilibrium can be established for each compound.</p>
<p>Defect formation energies &#x394;<italic>H</italic>
<sub>
<italic>D</italic>,<italic>q</italic>
</sub> are typically shown as a function of semiconductor Fermi level <italic>E</italic>
<sub>
<italic>F</italic>
</sub>, which varies from the valence band maximum (VBM) to conduction band minimum (CBM). Accurate chemical potentials and band gaps are prerequisites to obtaining accurate defect formation energies. In addition to discrepancies between experiment and DFT-HSE in formation energies, there are also discrepancies between DFT-HSE and experimental band gaps. The band gaps obtained using DFT-HSE for SnS, SnSe, and SnTe are 1.31, 1.09, and 0.18&#xa0;eV while the experimental band gaps are 1.2&#xa0;eV (<xref ref-type="bibr" rid="B6">Albers et al., 1960</xref>; <xref ref-type="bibr" rid="B81">Zhou et al., 2017</xref>), 0.9&#xa0;eV (<xref ref-type="bibr" rid="B42">Lefebvre et al., 1998</xref>), and 0.18&#xa0;eV (<xref ref-type="bibr" rid="B60">Rogers, 1968</xref>; <xref ref-type="bibr" rid="B20">Dimmock et al., 1966</xref>), showing differences that lie within the expected range of HSE band gap uncertainties.(see <xref ref-type="sec" rid="s10">Supplementary Table S1</xref>).</p>
<p>Carrier concentrations are exponential functions of defect formation energies, so small errors in defect formation energies can translate to large errors in predicted carrier concentrations. In the following, predicted carrier concentrations are shown for two cases: 1) the pure DFT-HSE prediction (labeled &#x201c;pure DFT&#x201d;), and 2) the DFT-HSE prediction with empirical corrections for chemical potentials and band gaps (labeled &#x201c;DFT &#x2b; Exp&#x201d;). For the latter, we adjusted the band gap by applying equal shifts to both band edge positions to match the experimental band gap. We further shifted the calculated total energies of each Sn binary to match the experimental formation energy. The comparison of the two sets of results allows us to estimate the degree of uncertainty in computed carrier concentrations.</p>
<sec id="s3-4-1">
<title>3.3.3 Defect chemistry of SnTe</title>
<p>Formation energies of native point defects in SnTe in both Sn-rich and Sn-poor growth conditions are shown in <xref ref-type="fig" rid="F6">Figures 6A,B</xref>. The native defects include vacancies V<sub>Sn</sub> and V<sub>Te</sub> and antisite defects Sn<sub>Te</sub> and Te<sub>Sn</sub>, all of which were considered in varying charge states. Following convention, we show only the minimum energy charge state of each defect in <xref ref-type="fig" rid="F6">Figure 6</xref>. Interstitial defects were originally considered for all three Sn chalcogenides at the PBE level, but were found to have higher formation energies compared to vacancies and antisites (<xref ref-type="sec" rid="s10">Supplementary Figure S4</xref>); therefore we did not include them in the DFT-HSE results for dopability analysis.</p>
<fig id="F6" position="float">
<label>FIGURE 6</label>
<caption>
<p>Defect formation energy for native point defects as a function of Fermi level (<italic>E</italic>
<sub>
<italic>F</italic>
</sub>) in SnTe under <bold>(A)</bold> Sn-rich and <bold>(B)</bold> Sn-poor growth conditions. In both growth conditions, V<sub>Sn</sub> is the dominant acceptor defect which pushes the Fermi level below the VBM and makes SnTe a degenerate <italic>p</italic>-type semiconductor. <bold>(C)</bold> Prediction of both hole and electron carrier concentrations as a function of temperature in Sn-rich and Sn-poor growth conditions.</p>
</caption>
<graphic xlink:href="femat-02-1059684-g006.tif"/>
</fig>
<p>Under both Sn-rich (<xref ref-type="fig" rid="F6">Figure 6A</xref>) and Sn-poor (<xref ref-type="fig" rid="F6">Figure 6B</xref>) growth conditions, Sn vacancies (V<sub>Sn</sub>) act as the dominant acceptor defect with ultra-low formation energy. The next lowest energy defects are the two antisites, which flip their relative energies between Sn-rich and Sn-poor conditions. The only donor defect, V<sub>Te</sub>, shows high formation energy across the full stability region. The ultra-low formation energy of acceptor V<sub>Sn</sub> for both extremes of growth conditions indicates that V<sub>Sn</sub> will be the dominant defect in SnTe across the full stability region. This result is consistent with the degenerate p-type behavior that is experimentally reported in SnTe (<xref ref-type="bibr" rid="B21">Doi et al., 2019</xref>; <xref ref-type="bibr" rid="B45">Ma et al., 2019</xref>; <xref ref-type="bibr" rid="B71">Tang et al., 2018</xref>; <xref ref-type="bibr" rid="B69">Tan et al., 2015</xref>). It is also consistent with the experimental observation that it is nearly impossible to synthesize stoichiometric SnTe (<xref ref-type="bibr" rid="B82">Zhou et al., 2014</xref>), with materials always showing cation deficiency. As also suggested in <xref ref-type="bibr" rid="B73">Wang et al. (2014)</xref>, we believe that the reason for the ultra-low formation energy of V<sub>Sn</sub> is related to the high band edge position of the VBM of the <italic>Fm3m</italic> phase of SnTe (on an absolute scale, in comparison to the subsequent compounds to be discussed below). For example, we found the formation energy of <italic>V</italic>
<sub>Sn</sub> and other acceptor defects to be comparatively higher in a hypothetical <italic>Pnma</italic> phase of SnTe and more similar to the <italic>Pnma</italic> phases of SnS and SnSe (see <xref ref-type="sec" rid="s10">Supplementary Figure S5</xref>).</p>
<p>For SnTe, the previous analysis from <xref ref-type="fig" rid="F3">Figure 3D</xref> indicated the possibility of improved <italic>zT</italic> if p-type carrier concentrations could be reduced. However, <xref ref-type="fig" rid="F6">Figure 6</xref> shows that this is not possible and provides an explanation for the large p-type carrier concentrations around 10<sup>20</sup>&#xa0;cm<sup>&#x2212;3</sup> in <xref ref-type="fig" rid="F3">Figure 3D</xref>. For both Sn-rich and Sn-poor cases, we found that the equilibrium Fermi energy <inline-formula id="inf21">
<mml:math id="m30">
<mml:msubsup>
<mml:mrow>
<mml:mi mathvariant="normal">E</mml:mi>
</mml:mrow>
<mml:mrow>
<mml:mi mathvariant="normal">F</mml:mi>
</mml:mrow>
<mml:mrow>
<mml:mi mathvariant="normal">e</mml:mi>
<mml:mi mathvariant="normal">q</mml:mi>
</mml:mrow>
</mml:msubsup>
</mml:math>
</inline-formula> resides inside the valence band: from charge neutrality constraints, the calculated <inline-formula id="inf22">
<mml:math id="m31">
<mml:msubsup>
<mml:mrow>
<mml:mi mathvariant="normal">E</mml:mi>
</mml:mrow>
<mml:mrow>
<mml:mi mathvariant="normal">F</mml:mi>
</mml:mrow>
<mml:mrow>
<mml:mi mathvariant="normal">e</mml:mi>
<mml:mi mathvariant="normal">q</mml:mi>
</mml:mrow>
</mml:msubsup>
</mml:math>
</inline-formula>&#x2019;s are 0.13 and 0.55&#xa0;eV below the VBM at 400&#xa0;K for Sn-rich to Sn-poor condition respectively. The corresponding hole and electron concentrations for these two extremes are shown as a function of temperature from 400&#xa0;K to 900&#xa0;K in <xref ref-type="fig" rid="F6">Figure 6C</xref>. Under the Sn-rich conditions most amenable to n-type material, the hole carrier concentration is around 10<sup>19</sup>&#xa0;cm<sup>&#x2212;3</sup> and the electron carrier concentration ranges from 1.22 &#xd7; 10<sup>14</sup> to 6.24 &#xd7; 10<sup>16</sup>&#xa0;cm<sup>&#x2212;3</sup>. At Sn-poor growth conditions the hole carrier concentration increases to <inline-formula id="inf23">
<mml:math id="m32">
<mml:mo>&#x223c;</mml:mo>
<mml:mn>1</mml:mn>
<mml:msup>
<mml:mrow>
<mml:mn>0</mml:mn>
</mml:mrow>
<mml:mrow>
<mml:mn>20</mml:mn>
</mml:mrow>
</mml:msup>
</mml:math>
</inline-formula>&#xa0;cm<sup>&#x2212;3</sup>, with negligible small electron carrier concentrations. Therefore, despite that the p-type and n-type TE performance of SnTe is predicted to exceed that of PbTe according to material descriptor <italic>&#x3b2;</italic>, defect analysis shows that the reduction of hole carriers (or realization of n-type material) is not feasible. The only reported n-type SnTe was found to occur upon substantial alloying with PbTe, as a result of lowering the position of the valence band edge (<xref ref-type="bibr" rid="B53">Pang et al., 2021</xref>). Therefore, combined analysis shows that improved p-type and good n-type TE performance will be challenging, if not impossible, in SnTe even in highly alloyed compositions.</p>
<p>Although the defect analysis suggests that tuning carrier concentrations in bulk material is challenging, other strategies for engineering SnTe may still be possible. For example, alloying with PbTe (<xref ref-type="bibr" rid="B53">Pang et al., 2021</xref>) and CaTe (<xref ref-type="bibr" rid="B5">Al Rahal Al Orabi et al., 2016</xref>) may help push the VBM lower, increasing <italic>V</italic>
<sub>Sn</sub> formation energies and reducing carrier concentrations. Alternatively, recent approaches to controlling disorder have been suggested as routes to TE performance optimization (<xref ref-type="bibr" rid="B61">Roychowdhury et al., 2021</xref>; <xref ref-type="bibr" rid="B4">Agne et al., 2021</xref>). In these cases, the use of disorder-induced carrier localization could be used for TE improvement <italic>via</italic> tuning of carrier mobilities in order to increase Seebeck coefficient while maintaining electrical conductivity. This strategy might also be helpful to reduce lattice thermal conductivity through nanostructuring as shown in Ref. <xref ref-type="bibr" rid="B61">Roychowdhury et al. (2021)</xref>. Finally, considerations of alternative scattering mechanisms or more sophisticated treatments of scattering, such as the four coefficient approach (<xref ref-type="bibr" rid="B19">Crawford et al., 2021</xref>), have been found to yield different optimized values for parameters such as carrier concentrations.</p>
</sec>
<sec id="s3-4-2">
<title>3.3.4 Defect chemistry of SnS</title>
<p>For SnS, it is of interest to determine whether it is possible to increase carrier concentrations to improve TE performance, particularly for n-type material. The formation energies of native point defects and their applicable charge states under Sn-poor and Sn-rich growth conditions from pure DFT are shown in <xref ref-type="fig" rid="F7">Figures 7A,B</xref> (the empirically corrected diagrams are shown in the <xref ref-type="sec" rid="s10">Supplementary Figure S6A</xref>). The equilibrium Fermi energy <inline-formula id="inf24">
<mml:math id="m33">
<mml:msubsup>
<mml:mrow>
<mml:mi mathvariant="normal">E</mml:mi>
</mml:mrow>
<mml:mrow>
<mml:mi mathvariant="normal">F</mml:mi>
</mml:mrow>
<mml:mrow>
<mml:mi mathvariant="normal">e</mml:mi>
<mml:mi mathvariant="normal">q</mml:mi>
</mml:mrow>
</mml:msubsup>
</mml:math>
</inline-formula> at 400&#xa0;K is shown by the dashed line. Distinct from SnTe, now in both growth conditions V<sub>Sn</sub> and V<sub>S</sub> act as the main acceptor and donor defects respectively. These two defects compete, and their relative formation energies at each invariant point determine the position of <inline-formula id="inf25">
<mml:math id="m34">
<mml:msubsup>
<mml:mrow>
<mml:mi mathvariant="normal">E</mml:mi>
</mml:mrow>
<mml:mrow>
<mml:mi mathvariant="normal">F</mml:mi>
</mml:mrow>
<mml:mrow>
<mml:mi mathvariant="normal">e</mml:mi>
<mml:mi mathvariant="normal">q</mml:mi>
</mml:mrow>
</mml:msubsup>
</mml:math>
</inline-formula>. In Sn-poor conditions, V<sub>Sn</sub> has a relatively low, and V<sub>S</sub> a relatively high, formation energy giving rise to more p-type conditions. In Sn-rich conditions, V<sub>Sn</sub> has a relatively high, and V<sub>S</sub> a relatively low, formation energy giving rise to more n-type conditions. The equilibrium Fermi energy at 400&#xa0;K varies between 0.61 and 0.68&#xa0;eV above the VBM within the chemical potential range. Overall, since the cation vacancy <italic>V</italic>
<sub>Sn</sub> no longer dominates as the governing defect as in SnTe, a larger dopability window for both p-type and n-type material is present.</p>
<fig id="F7" position="float">
<label>FIGURE 7</label>
<caption>
<p>Defect formation energies as a function of Fermi level in SnS (<italic>Pnma</italic>) for <bold>(A)</bold> Sn-poor and <bold>(B)</bold> Sn-rich growth condition. Intrinsic and ideal carrier concentrations for <bold>(C)</bold> holes in Sn-poor, and <bold>(D)</bold> electrons in Sn-rich, conditions as a function of temperature. For <bold>(C,D)</bold>, lighter shades indicate the carrier concentrations for undoped materials and darker shades indicate carrier concentrations for ideal extrinsically doped materials. While ideal <inline-formula id="inf26">
<mml:math id="m35">
<mml:msubsup>
<mml:mrow>
<mml:mi>E</mml:mi>
</mml:mrow>
<mml:mrow>
<mml:mi>F</mml:mi>
</mml:mrow>
<mml:mrow>
<mml:mi>e</mml:mi>
<mml:mi>q</mml:mi>
</mml:mrow>
</mml:msubsup>
</mml:math>
</inline-formula> falls below the VBM in <bold>(A)</bold> Sn-poor case (hole carriers), <inline-formula id="inf27">
<mml:math id="m36">
<mml:msubsup>
<mml:mrow>
<mml:mi>E</mml:mi>
</mml:mrow>
<mml:mrow>
<mml:mi>F</mml:mi>
</mml:mrow>
<mml:mrow>
<mml:mi>e</mml:mi>
<mml:mi>q</mml:mi>
</mml:mrow>
</mml:msubsup>
</mml:math>
</inline-formula> is shown as a pink dot for <bold>(B)</bold> Sn-rich case (electron carriers).</p>
</caption>
<graphic xlink:href="femat-02-1059684-g007.tif"/>
</fig>
<p>However, SnS also has a wider band gap compared to SnTe (1.31&#xa0;eV vs. 0.18&#xa0;eV), making it more difficult to achieve high carrier concentration. To assess the maximum p-type and n-type carrier concentration achievable in SnS, we calculated both the <italic>intrinsic</italic> and the <italic>ideal</italic> carrier concentration in Sn-poor and Sn-rich growth conditions. The intrinsic carrier concentration refers to the carrier concentration that can be achieved without the introduction of extrinsic dopants. It arises from the range of accessible equilibrium Fermi levels <inline-formula id="inf28">
<mml:math id="m37">
<mml:msubsup>
<mml:mrow>
<mml:mi mathvariant="normal">E</mml:mi>
</mml:mrow>
<mml:mrow>
<mml:mi mathvariant="normal">F</mml:mi>
</mml:mrow>
<mml:mrow>
<mml:mi mathvariant="normal">e</mml:mi>
<mml:mi mathvariant="normal">q</mml:mi>
</mml:mrow>
</mml:msubsup>
</mml:math>
</inline-formula> throughout chemical potential space. On the other hand, the ideal carrier concentration describes the maximum achievable p-type or n-type carrier concentration throughout chemical potential space. As indicated in <xref ref-type="fig" rid="F7">Figure 7B</xref>, it is found by assuming the presence of an ideal extrinsic dopant that pushes the Fermi level to where the lowest energy compensating defect (here, an acceptor in n-type material) has formation energy of zero. Although in practice it is difficult or impossible to identify an ideal extrinsic dopant, the ideal dopability serves as an upperbound to the achievable carrier concentration (<xref ref-type="bibr" rid="B58">Qu et al., 2021</xref>).</p>
<p>The predicted intrinsic and ideal hole carrier concentrations are shown in <xref ref-type="fig" rid="F7">Figure 7C</xref>. Light colors indicate intrinsic and dark colors ideal hole concentrations at Sn-poor conditions. The intrinsic hole carrier concentration at 923&#xa0;K from pure DFT is predicted to be 2.8 &#xd7; 10<sup>17</sup>cm<sup>&#x2212;3</sup>, and increases to 9.8 &#xd7; 10<sup>17</sup>cm<sup>&#x2212;3</sup> when empirical corrections to band gap and chemical potentials are applied. These values match fairly closely with reported experimental measurements for undoped material which range from 4 &#xd7; 10<sup>17</sup>&#x2013;10<sup>18</sup>&#xa0;cm<sup>&#x2212;3</sup> at similar temperatures (<xref ref-type="bibr" rid="B70">Tan et al., 2014</xref>; <xref ref-type="bibr" rid="B1">Abraham et al., 1978</xref>). As an upperbound, with an ideal p-type dopant, hole carrier concentrations on the order of 10<sup>20</sup>&#xa0;cm<sup>&#x2212;3</sup> would be achievable. Reported carrier concentrations for doped or alloyed SnS range between 2 &#xd7; 10<sup>18</sup> to 3 &#xd7; 10<sup>19</sup>&#xa0;cm<sup>&#x2212;3</sup> (<xref ref-type="bibr" rid="B81">Zhou et al., 2017</xref>; <xref ref-type="bibr" rid="B70">Tan et al., 2014</xref>; <xref ref-type="bibr" rid="B33">He et al., 2019</xref>; <xref ref-type="bibr" rid="B11">Cai B et al., 2020</xref>). Our combined analysis using <italic>&#x3b2;</italic> and dopability predictions suggest that there is opportunity to achieve higher p-type <italic>zT</italic> through improving hole carrier concentration by extrinsic doping.</p>
<p>To assess achievable n-type performance, predicted intrinsic and ideal electron carrier concentrations are shown in <xref ref-type="fig" rid="F7">Figure 7D</xref>. Compared to hole carrier concentrations in <xref ref-type="fig" rid="F7">Figure 7C</xref>, achievable electron carrier concentrations are generally lower. For intrinsic material again at 923&#xa0;K, we predict carrier concentrations of 1.4 &#xd7; 10<sup>16</sup>&#xa0;cm<sup>&#x2212;3</sup> for pure DFT and 3.6 &#xd7; 10<sup>16</sup>&#xa0;cm<sup>&#x2212;3</sup> for empirically-corrected DFT, about an order of magnitude lower than the corresponding p-type values. The predicted ideal electron concentration suggests that with an ideal n-type dopant, electron carrier concentrations on the order of 10<sup>19</sup>&#xa0;cm<sup>&#x2212;3</sup> might be achievable suggesting that SnS is n-type dopable. To date, n-type carrier concentrations in extrinsically doped or alloyed SnS lie around <inline-formula id="inf29">
<mml:math id="m38">
<mml:mo>&#x223c;</mml:mo>
<mml:mn>1</mml:mn>
<mml:msup>
<mml:mrow>
<mml:mn>0</mml:mn>
</mml:mrow>
<mml:mrow>
<mml:mn>17</mml:mn>
</mml:mrow>
</mml:msup>
</mml:math>
</inline-formula>&#xa0;cm<sup>&#x2212;3</sup> (<xref ref-type="bibr" rid="B80">Zhi-Cheng et al., 2019</xref>; <xref ref-type="bibr" rid="B34">Hu et al., 2019</xref>). Similar to p-type SnS, the combined intrinsic property and dopability analysis here suggests that there is an opportunity for improvement in n-type <italic>zT</italic> if suitable extrinsic dopants can be found.</p>
</sec>
<sec id="s3-4-3">
<title>3.3.5 Defect chemistry of SnSe</title>
<p>Lastly, focusing on n-type performance, we analyze the dopability of SnSe in the <italic>Pnma</italic> phase to evaluate whether it is possible to tune carrier concentration to improve TE performance. Only the defect chemistry at Sn-rich growth condition is shown in <xref ref-type="fig" rid="F8">Figure 8A</xref> from pure DFT (the empircally corrected diagrams for both Sn-rich and Sn-poor condition are shown in the <xref ref-type="sec" rid="s10">Supplementary Figure S6B</xref>). Similar to SnS, <italic>V</italic>
<sub>Sn</sub> and <italic>V</italic>
<sub>Se</sub> act as the primary acceptor and donor defects respectively, and their relative energies determine the position of <inline-formula id="inf30">
<mml:math id="m39">
<mml:msubsup>
<mml:mrow>
<mml:mi mathvariant="normal">E</mml:mi>
</mml:mrow>
<mml:mrow>
<mml:mi mathvariant="normal">F</mml:mi>
</mml:mrow>
<mml:mrow>
<mml:mi mathvariant="normal">e</mml:mi>
<mml:mi mathvariant="normal">q</mml:mi>
</mml:mrow>
</mml:msubsup>
</mml:math>
</inline-formula>. In Sn-rich conditions, the equilibrium Fermi energy is located at 0.59&#xa0;eV above the VBM at 400&#xa0;K. Moreover, SnSe has a smaller band gap than SnS, making it easier to achieve a higher carrier concentration.</p>
<fig id="F8" position="float">
<label>FIGURE 8</label>
<caption>
<p>
<bold>(A)</bold> Defect formation energies as a function of Fermi level, and <bold>(B)</bold> intrinsic and ideal carrier concentrations for electrons under Sn-rich growth conditions in SnSe (<italic>Pnma</italic>). The lighter and darker shades in <bold>(B)</bold> indicate electron carrier concentrations for undoped and ideal extrinsically doped materials, respectively.</p>
</caption>
<graphic xlink:href="femat-02-1059684-g008.tif"/>
</fig>
<p>Predicted intrinsic and ideal electron carrier concentrations are shown in <xref ref-type="fig" rid="F8">Figure 8B</xref>. For intrinsic material at 800&#xa0;K, we predict carrier concentrations of 9.6 &#xd7; 10<sup>15</sup>&#xa0;cm<sup>&#x2212;3</sup> for pure DFT and 6.11 &#xd7; 10<sup>16</sup>&#xa0;cm<sup>&#x2212;3</sup> for empirically-corrected DFT. Here the order of magnitude difference arises from the &#x223c;0.2&#xa0;eV band gap difference between DFT-HSE and experiment. The predicted ideal electron concentration suggests that electron carrier concentrations ranging between 10<sup>19</sup> to 10<sup>20</sup>&#xa0;cm<sup>&#x2212;3</sup> might be achievable from pure and empirically-corrected DFT, respectively. To date, n-type carrier concentrations in extrinsically doped or alloyed SnSe lie on the order of <inline-formula id="inf31">
<mml:math id="m40">
<mml:mo>&#x223c;</mml:mo>
<mml:mn>1</mml:mn>
<mml:msup>
<mml:mrow>
<mml:mn>0</mml:mn>
</mml:mrow>
<mml:mrow>
<mml:mn>19</mml:mn>
</mml:mrow>
</mml:msup>
</mml:math>
</inline-formula>&#xa0;cm<sup>&#x2212;3</sup> (<xref ref-type="bibr" rid="B77">Zhang et al., 2015</xref>; <xref ref-type="bibr" rid="B22">Duong et al., 2016</xref>; <xref ref-type="bibr" rid="B16">Chang et al., 2016</xref>; <xref ref-type="bibr" rid="B64">Shang et al., 2019</xref>; <xref ref-type="bibr" rid="B14">Cha et al., 2019</xref>; <xref ref-type="bibr" rid="B12">Cai J et al., 2020</xref>; <xref ref-type="bibr" rid="B32">Gu et al., 2021</xref>) which suggests that slight improvements in n-type <italic>zT</italic> might be possible in SnSe.</p>
</sec>
</sec>
</sec>
<sec id="s4">
<title>4 Conclusion</title>
<p>In this work, we studied the TE quality factor approach to identify improvement opportunities in TE performance in the well-known Sn-based IV-VI binary compounds SnS, SnSe, and SnTe focusing on intrinsic properties and dopability. First, we predicted <italic>zT</italic> using the TE quality factor formalism through estimations of parameter <italic>&#x3b2;</italic>. The predicted value of <italic>&#x3b2;</italic> for n and p-type versions of all three materials results in distinct target carrier concentrations for each material, with SnS requiring larger, and SnTe requiring lower, carrier concentrations. Although comparison of these predictions to a comprehensive literature search revealed opportunities for improvement in all three Sn chalcogenides, the subsequent dopability analysis showed that the defect chemistry of each material constrains its TE performance in a distinct way. In SnS, improved TE performance in both p-type and n-type material can be achieved if suitable extrinsic dopants can be found. For SnSe, the p-type performance in the <italic>Cmcm</italic> phase appears to have reached its potential, but improved n-type TE performance can be achieved in the <italic>Pnma</italic> phase through proper tuning of electron carrier concentration. For SnTe both p-type and n-type performance is constrained by the degenerate p-type carrier concentrations arising from the abundance of low energy V<sub>Sn</sub> defects. Through this work, we aim to show the importance of carefully considering both intrinsic and extrinsic properties in a computation-guided search, as a general strategy to be utilized across diverse arrays of materials for TE application. It is of future interest to carry out comprehensive quantitative comparisons between computationally-predicted and experimentally-measured performance in diverse families of materials as demonstrated here for binary chalcogenides as a way to benchmark the accuracy attainable and typical uncertainties in first-principles approaches to TE materials.</p>
</sec>
</body>
<back>
<sec sec-type="data-availability" id="s5">
<title>Data availability statement</title>
<p>The datasets presented in this study can be found in online repositories. The names of the repository/repositories and accession number(s) can be found below: <ext-link ext-link-type="uri" xlink:href="https://github.com/ertekin-research-group/2022-Bipasha-Sn-Binaries">https://github.com/ertekin-research-group/2022-Bipasha-Sn-Binaries</ext-link>.</p>
</sec>
<sec id="s6">
<title>Author contributions</title>
<p>FB and EE contributed to conception and design of the study. FB, LG, and JQ performed the computational simulations and analysis of results. FB wrote the first draft of the manuscript. All authors contributed to manuscript revision, read, and approved the submitted version.</p>
</sec>
<sec id="s7">
<title>Funding</title>
<p>This work was funded with support from the US National Science Foundation (NSF) <italic>via</italic> Grant No. DMR 1729149 and the DIGI-MAT program, Grant No. 1922758.</p>
</sec>
<ack>
<p>Computational resources were provided by the Extreme Science and Engineering Discovery Environment <xref ref-type="bibr" rid="B72">Towns et al. (2014)</xref>, now ACCESS (Advanced Cyberinfrastructure Coordination Ecosystem: Services Support) through Bridges-2 at the Pittsburgh Supercomputing Center through allocation TG-MAT220011.</p>
</ack>
<sec sec-type="COI-statement" id="s8">
<title>Conflict of interest</title>
<p>The authors declare that the research was conducted in the absence of any commercial or financial relationships that could be construed as a potential conflict of interest.</p>
</sec>
<sec sec-type="disclaimer" id="s9">
<title>Publisher&#x2019;s note</title>
<p>All claims expressed in this article are solely those of the authors and do not necessarily represent those of their affiliated organizations, or those of the publisher, the editors and the reviewers. Any product that may be evaluated in this article, or claim that may be made by its manufacturer, is not guaranteed or endorsed by the publisher.</p>
</sec>
<sec id="s10">
<title>Supplementary material</title>
<p>The Supplementary Material for this article can be found online at: <ext-link ext-link-type="uri" xlink:href="https://www.frontiersin.org/articles/10.3389/femat.2022.1059684/full#supplementary-material">https://www.frontiersin.org/articles/10.3389/femat.2022.1059684/full&#x23;supplementary-material</ext-link>
</p>
<supplementary-material xlink:href="DataSheet1.PDF" id="SM1" mimetype="application/PDF" xmlns:xlink="http://www.w3.org/1999/xlink"/>
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