<?xml version="1.0" encoding="UTF-8"?>
<!DOCTYPE article PUBLIC "-//NLM//DTD Journal Publishing DTD v2.3 20070202//EN" "journalpublishing.dtd">
<article article-type="research-article" dtd-version="2.3" xml:lang="EN" xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">
<front>
<journal-meta>
<journal-id journal-id-type="publisher-id">Front. Chem.</journal-id>
<journal-title>Frontiers in Chemistry</journal-title>
<abbrev-journal-title abbrev-type="pubmed">Front. Chem.</abbrev-journal-title>
<issn pub-type="epub">2296-2646</issn>
<publisher>
<publisher-name>Frontiers Media S.A.</publisher-name>
</publisher>
</journal-meta>
<article-meta>
<article-id pub-id-type="publisher-id">733383</article-id>
<article-id pub-id-type="doi">10.3389/fchem.2021.733383</article-id>
<article-categories>
<subj-group subj-group-type="heading">
<subject>Chemistry</subject>
<subj-group>
<subject>Original Research</subject>
</subj-group>
</subj-group>
</article-categories>
<title-group>
<article-title>Magnetic Properties of Electrodeposited Cobalt-Platinum (CoPt) and Cobalt-Platinum-Phosphide (CoPtP) Thin Films</article-title>
<alt-title alt-title-type="left-running-head">Park and Myung</alt-title>
<alt-title alt-title-type="right-running-head">Magnetic Properties of Cobalt&#x2010;Platinum Alloys</alt-title>
</title-group>
<contrib-group>
<contrib contrib-type="author" corresp="yes">
<name>
<surname>Park</surname>
<given-names>D.-Y.</given-names>
</name>
<xref ref-type="aff" rid="aff1">
<sup>1</sup>
</xref>
<xref ref-type="corresp" rid="c001">&#x2a;</xref>
<uri xlink:href="https://loop.frontiersin.org/people/1390736/overview"/>
</contrib>
<contrib contrib-type="author">
<name>
<surname>Myung</surname>
<given-names>N. V.</given-names>
</name>
<xref ref-type="aff" rid="aff2">
<sup>2</sup>
</xref>
<uri xlink:href="https://loop.frontiersin.org/people/93843/overview"/>
</contrib>
</contrib-group>
<aff id="aff1">
<label>
<sup>1</sup>
</label>Department of Advanced Materials Engineering, Hanbat National University, <addr-line>Daejeon</addr-line>, <country>South Korea</country>
</aff>
<aff id="aff2">
<label>
<sup>2</sup>
</label>Department of Chemical and Biomolecular Engineering, University of Notre Dame, <addr-line>Notre Dame</addr-line>, <addr-line>IN</addr-line>, <country>United&#x20;States</country>
</aff>
<author-notes>
<fn fn-type="edited-by">
<p>
<bold>Edited by:</bold> <ext-link ext-link-type="uri" xlink:href="https://loop.frontiersin.org/people/578335/overview">Xiaopeng Han</ext-link>, Tianjin University, China</p>
</fn>
<fn fn-type="edited-by">
<p>
<bold>Reviewed by:</bold> <ext-link ext-link-type="uri" xlink:href="https://loop.frontiersin.org/people/569059/overview">Edward Gillan</ext-link>, The University of Iowa, United&#x20;States</p>
<p>
<ext-link ext-link-type="uri" xlink:href="https://loop.frontiersin.org/people/1013282/overview">Yunpei Zhu</ext-link>, King Abdullah University of Science and Technology, Saudi Arabia</p>
</fn>
<corresp id="c001">&#x2a;Correspondence: D.-Y. Park, <email>dypark@hanbat.ac.kr</email>
</corresp>
<fn fn-type="other">
<p>This article was submitted to Electrochemistry, a section of the journal Frontiers in Chemistry</p>
</fn>
</author-notes>
<pub-date pub-type="epub">
<day>10</day>
<month>09</month>
<year>2021</year>
</pub-date>
<pub-date pub-type="collection">
<year>2021</year>
</pub-date>
<volume>9</volume>
<elocation-id>733383</elocation-id>
<history>
<date date-type="received">
<day>30</day>
<month>06</month>
<year>2021</year>
</date>
<date date-type="accepted">
<day>30</day>
<month>08</month>
<year>2021</year>
</date>
</history>
<permissions>
<copyright-statement>Copyright &#xa9; 2021 Park and Myung.</copyright-statement>
<copyright-year>2021</copyright-year>
<copyright-holder>Park and Myung</copyright-holder>
<license xlink:href="http://creativecommons.org/licenses/by/4.0/">
<p>This is an open-access article distributed under the terms of the Creative Commons Attribution License (CC BY). The use, distribution or reproduction in other forums is permitted, provided the original author(s) and the copyright owner(s) are credited and that the original publication in this journal is cited, in accordance with accepted academic practice. No use, distribution or reproduction is permitted which does not comply with these&#x20;terms.</p>
</license>
</permissions>
<abstract>
<p>CoPt and CoPtP thin films were synthesized using direct current (DC) aqueous electrodeposition from weak alkaline solutions. The basic plating solutions of binary CoPt thin films consisted of cobalt pyrophosphate [Co<sub>2</sub>P<sub>2</sub>O<sub>7</sub>] and chloroplatinic acid [H<sub>2</sub>PtCl<sub>6</sub>]. Various amounts of sodium hypophosphite [NaH<sub>2</sub>PO<sub>2</sub>] was added to deposit ternary CoPtP thin films. The film composition was adjusted by varying the several electrodeposition parameters including electrolyte composition, solution pH, and current density and correlated to their microstructure and magnetic property (<italic>i.e.</italic> coercivity and squareness). For the binary CoPt thin films, the maximum coercivities [in-plane coercivity (H<sub>c,//</sub>) &#x3d; &#x223c;1,600&#xa0;Oe, and perpendicular coercivity (H<sub>c,&#x22a5;</sub>) &#x3d; &#x223c;2,500&#xa0;Oe] were obtained from electrolytes containing 0.01&#xa0;M H<sub>2</sub>PtCl<sub>6</sub> &#x2b; 0.04&#xa0;M Co<sub>2</sub>P<sub>2</sub>O<sub>7</sub> at current density (CD) of 7.5&#xa0;mA&#xa0;cm<sup>&#x2212;2</sup>. In the case of ternary CoPtP electrodeposits, the maximum coercivities (H<sub>c,//</sub> &#x3d; &#x223c;2,600&#xa0;Oe, and H<sub>c,&#x22a5;</sub> &#x3d; &#x223c;3,800&#xa0;Oe) were achieved from baths containing 0.015&#xa0;M H<sub>2</sub>PtCl<sub>6</sub>, 0.07&#xa0;M Co<sub>2</sub>P<sub>2</sub>O<sub>7</sub>, 0.8&#xa0;M NaH<sub>2</sub>PO<sub>2</sub> at CD of 7.5&#xa0;mA&#xa0;cm<sup>&#x2212;</sup>
<sup>2</sup> and solution pH 9. It was suggested that microstructure and magnetic properties are affected not only by the type of substrate but also by chemical compositions and electrodeposition conditions.</p>
</abstract>
<kwd-group>
<kwd>cobalt-platinum</kwd>
<kwd>cobalt-platinum-phosphide</kwd>
<kwd>electrodeposition</kwd>
<kwd>magnetic thin film</kwd>
<kwd>hard magnetic material</kwd>
</kwd-group>
</article-meta>
</front>
<body>
<sec id="s1">
<title>Introduction</title>
<p>CoPt and CoPtP alloys are promising hard magnetic materials due to their high magnetocrystalline anisotropy and magnetic saturation (<xref ref-type="bibr" rid="B1">Bozorth, 1963</xref>; <xref ref-type="bibr" rid="B12">Myung et&#x20;al., 2003</xref>). Co<sub>50</sub>Pt<sub>50</sub> alloy has tetragonal L1<sub>O</sub> ordered phase material and shows very high coercivities (&#x3e;10,000&#xa0;Oe) (<xref ref-type="bibr" rid="B3">Coffey et&#x20;al., 1995</xref>). Because of their excellent hard magnetic properties, they are of interest in the areas such as magnetic sensors and magnetic microelectromechanical systems (mag-MEMS) (<xref ref-type="bibr" rid="B12">Myung et&#x20;al., 2003</xref>; <xref ref-type="bibr" rid="B13">Park et&#x20;al., 1995</xref>; <xref ref-type="bibr" rid="B17">Vieux-Rochaz et&#x20;al., 2006</xref>).</p>
<p>CoPt thin films were mostly obtained using vacuum processes such as molecular-beam epitaxy (MBE) (<xref ref-type="bibr" rid="B11">Lee et&#x20;al., 1991</xref>), and sputtering (<xref ref-type="bibr" rid="B3">Coffey et&#x20;al., 1995</xref>; <xref ref-type="bibr" rid="B2">Carcia et&#x20;al., 1993</xref>; <xref ref-type="bibr" rid="B7">Farrow and Marks, 1998</xref>). In these vacuum processes, CoPt was deposited as multilayered structures and followed by post thermal treatment to make ordered phases. The requirement of post thermal treatment limited the applications including mag-MEMS since most of MEMS structure cannot survive at these high temperatures (e.g., 500&#x2013;700 &#xb0;C). Therefore, an alternative near room temperature deposition process such as electrodeposition is needed. Electrodeposition process over vacuum processes has many benefits such as easy scale up and maintenance, lower operating temperature, low cost, the ability of tailoring microstructure and properties. Therefore, it was widely used in many research fields including thin film, nanostructures including nanocrystals, nanorod etc. (<xref ref-type="bibr" rid="B13">Park et&#x20;al., 1995</xref>; <xref ref-type="bibr" rid="B12">Myung et&#x20;al, 2003</xref>; <xref ref-type="bibr" rid="B22">Zhu et&#x20;al., 2015a</xref>; <xref ref-type="bibr" rid="B23">Zhu et&#x20;al., 2015b</xref>).</p>
<p>Despite the needs for integration of magnetic CoPt and CoPtP alloys by electrodeposition at near room temperature, limited works were carried out for electrodeposition baths and conditions. Tabakovic et&#x20;al. and Dragos-Pinzaru et&#x20;al. conducted electroanalytical study and electroplating parameters (e.g., electrodeposition time, Co<sup>2&#x2b;</sup> concentration, additive, solution pH etc.) on film composition and magnetic properties (<xref ref-type="bibr" rid="B16">Tabakovic et&#x20;al., 2015</xref>; <xref ref-type="bibr" rid="B15">Tabakovic et&#x20;al., 2016</xref>; <xref ref-type="bibr" rid="B4">Dragos-Pinzaru et&#x20;al., 2017</xref>). Kim et&#x20;al. also investigated magnetic properties (<italic>e.g.,</italic> coercivity, magnetic moment etc.) to film thickness (<xref ref-type="bibr" rid="B10">Kim et&#x20;al., 2013</xref>). Guillamat et&#x20;al. electrodeposited CoPt thin film from deep eutectic solvent (<xref ref-type="bibr" rid="B8">Guillamat et&#x20;al., 2012</xref>) whereas Hnida et&#x20;al. electrodeposited nanowires using template directed method (<xref ref-type="bibr" rid="B9">Hnida et&#x20;al., 2016</xref>). Eagleton et&#x20;al. reported coercivity of 2,000&#x2013;4,000&#xa0;Oe for 50&#xa0;nm&#x2013;10&#xa0;&#x3bc;m thick CoPtP films (<xref ref-type="bibr" rid="B6">Eagleton et&#x20;al., 2005</xref>). Vieux-Rochaz et&#x20;al. integrated hard magnetic CoPtP material into mag-MEMS (<xref ref-type="bibr" rid="B17">Vieux-Rochaz et&#x20;al., 2006</xref>).</p>
<p>In this study, magnetic CoPt and CoPtP thin film alloys were systematically electrodeposited using the various plating solutions containing chloroplatinic acid, cobalt pyrophosphate and sodium hypophosphite. Dependence of various electrodeposition parameters including solution composition (e.g [Pt<sup>4&#x2b;</sup>] [Co<sup>2&#x2b;</sup>] and [H<sub>2</sub>PO<sub>2</sub>
<sup>&#x2212;</sup>]), solution pH, current density on current efficiency, magnetic properties, and microstructure were investigated.</p>
</sec>
<sec id="s2">
<title>Experimental</title>
<p>For binary CoPt thin films, the dependence of deposit contents, current efficiencies, and extrinsic magnetic properties (<italic>i.e.,</italic> coercivity and squareness) on Co<sup>2&#x2b;</sup> ion concentration in plating baths was investigated. The bath compositions and operating conditions are listed in <xref ref-type="table" rid="T1">Table&#x20;1</xref> (conditions for <xref ref-type="fig" rid="F1">Figures 1</xref>,<xref ref-type="fig" rid="F2">2</xref>). Co<sup>2&#x2b;</sup> concentration in the bath was controlled using Co-pyrophosphate solution as shown in <xref ref-type="table" rid="T2">Table&#x20;2</xref> (conditions for <xref ref-type="fig" rid="F1">Figures 1</xref>,<xref ref-type="fig" rid="F2">2</xref>). After the optimum Co<sup>2&#x2b;</sup> concentration in the bath for the best coercivity (H<sub>c,&#x22a5;</sub> and H<sub>c,//</sub>) of CoPt thin film was determined, the dependence of current efficiency and coercivity in CoPt thin films on concentration of Pt<sup>4&#x2b;</sup> in plating bath was studied. The bath compositions and operating conditions are listed in <xref ref-type="table" rid="T1">Table&#x20;1</xref> (conditions for <xref ref-type="fig" rid="F3">Figures 3</xref>,<xref ref-type="fig" rid="F4">4</xref>). Both Co<sup>2&#x2b;</sup> and Pt<sup>4&#x2b;</sup> concentrations for the optimum coercivity of CoPt thin film were determined as 0.07 and 0.015 M, respectively and listed in <xref ref-type="table" rid="T1">Table&#x20;1</xref> (conditions for <xref ref-type="fig" rid="F3">Figures 3</xref>,<xref ref-type="fig" rid="F5">5</xref>). Dependence of current efficiencies in the CoPt thin films on solution pH was also studied. Then a better bath composition and solution pH (conditions for <xref ref-type="fig" rid="F6">Figures 6</xref>,<xref ref-type="fig" rid="F7">7</xref>,<xref ref-type="fig" rid="F8">8</xref>) was determined as shown in <xref ref-type="table" rid="T1">Table&#x20;1</xref>. The optimum current density for the best coercivity of CoPt thin film was tested using the bath compositions and conditions of <xref ref-type="table" rid="T1">Table&#x20;1</xref> with/without NaH<sub>2</sub>PO<sub>2</sub> concentration (as P source). Finally, the optimum electroplating conditions for the best coercivity of CoPt thin film as shown in <xref ref-type="table" rid="T1">Table&#x20;1</xref> (conditions for <xref ref-type="fig" rid="F9">Figure&#x20;9</xref>) was obtained. Magnetic properties [parallel (in-plane) and perpendicular (out-of-plane) coercivity (H<sub>c,//</sub> and H<sub>c,&#x22a5;</sub>), and parallel (in-plane) and perpendicular (out-of-plane) squareness (S<sub>//</sub> and S<sub>&#x22a5;</sub>)] were examined by varying the NaH<sub>2</sub>PO<sub>2</sub> concentration from 0.01 to 0.8&#xa0;M. All the CoPt and CoPtP thin films were electrodeposited on brass substrates; Pt (mesh) coated on Ti core was used as an insoluble anode. Brass substrates were used because they exhibit no magnetic property, specially coercivity and squareness, at all. Solutions were exposed to air. All the films were electrodeposited without stirring at room temperature.</p>
<table-wrap id="T1" position="float">
<label>TABLE 1</label>
<caption>
<p>Bath compositions and operating conditions (unless otherwise noted) for binary CoPt thin films (M &#x3d; mol&#xa0;dm<sup>&#x2212;3</sup>).</p>
</caption>
<table>
<thead valign="top">
<tr>
<th align="left">Chemical/condition</th>
<th colspan="5" align="center">Concentration/unit</th>
</tr>
</thead>
<tbody valign="top">
<tr>
<td align="left">Pt<sup>4&#x2b;</sup> (as H<sub>2</sub>PtCl<sub>6</sub>&#x2219;6H<sub>2</sub>O) (M)</td>
<td align="center">0.01</td>
<td align="center">0.005&#x2013;0.025</td>
<td align="center">0.015</td>
<td align="center">0.01</td>
<td align="center">0.015</td>
</tr>
<tr>
<td align="left">Co<sup>2&#x2b;</sup> (as Co<sub>2</sub>P<sub>2</sub>O<sub>7</sub> referred to <xref ref-type="table" rid="T2">Table&#x20;2</xref>) (M)</td>
<td align="center">0.005&#x2013;0.1</td>
<td align="center">0.07</td>
<td align="center">0.07</td>
<td align="center">0.02</td>
<td align="center">0.07</td>
</tr>
<tr>
<td align="left">Na<sub>3</sub>PO<sub>4</sub>&#x2219;12H<sub>2</sub>O (M)</td>
<td align="center">0.365</td>
<td align="center">0.365</td>
<td align="center">0.365</td>
<td align="center">0.365</td>
<td align="center">0.365</td>
</tr>
<tr>
<td align="left">NaH<sub>2</sub>PO<sub>2</sub>&#x2219;H<sub>2</sub>O (M)</td>
<td align="center">&#x2014;</td>
<td align="center">&#x2014;</td>
<td align="center">&#x2014;</td>
<td align="center">0 or 0.1</td>
<td align="center">0.01&#x2013;0.8</td>
</tr>
<tr>
<td align="left">Solution pH</td>
<td align="center">8</td>
<td align="center">8</td>
<td align="center">7&#x2013;10</td>
<td align="center">8</td>
<td align="center">9</td>
</tr>
<tr>
<td align="left">Current density (mA&#x2219;cm<sup>&#x2212;2</sup>)</td>
<td align="center">7.5</td>
<td align="center">7.5</td>
<td align="center">7.5&#x2013;100</td>
<td align="center">7.5&#x2013;100</td>
<td align="center">7.5</td>
</tr>
<tr>
<td align="left">Deposit charge (C) (deposit time) (sec)</td>
<td align="center">15 (2,000)</td>
<td align="center">15 (2,000)</td>
<td align="center">15 (2,000)</td>
<td align="center">15 (2,000)</td>
<td align="center">15 (2,000)</td>
</tr>
<tr>
<td align="left">Corresponding figures</td>
<td align="center">1 and 2</td>
<td align="center">3 and 4</td>
<td align="center">3 and 5</td>
<td align="center">6, 7 and 8</td>
<td align="center">9</td>
</tr>
</tbody>
</table>
</table-wrap>
<fig id="F1" position="float">
<label>FIGURE 1</label>
<caption>
<p>Dependence of Co, Pt contents and current efficiency (CE) of CoPt thin film on Co-pyrophosphate concentration.</p>
</caption>
<graphic xlink:href="fchem-09-733383-g001.tif"/>
</fig>
<fig id="F2" position="float">
<label>FIGURE 2</label>
<caption>
<p>Dependence of coercivity and squareness of CoPt thin films on Co-pyrophosphate concentration <bold>(A)</bold> coercivity and <bold>(B)</bold> squareness.</p>
</caption>
<graphic xlink:href="fchem-09-733383-g002.tif"/>
</fig>
<table-wrap id="T2" position="float">
<label>TABLE 2</label>
<caption>
<p>Bath compositions (unless otherwise noted) for Co-pyrophosphate solution (M &#x3d; mol&#xa0;dm<sup>&#x2212;3</sup>).</p>
</caption>
<table>
<thead valign="top">
<tr>
<th align="left">Chemical/condition</th>
<th align="left">Concentration (M)/unit</th>
</tr>
</thead>
<tbody valign="top">
<tr>
<td align="left">Co<sup>2&#x2b;</sup> (as CoSO<sub>4</sub>&#x2219;7H<sub>2</sub>O)</td>
<td align="left">0.120&#xa0;M</td>
</tr>
<tr>
<td align="left">Na<sub>4</sub>P<sub>2</sub>O<sub>7</sub>
</td>
<td align="left">0.451&#xa0;M</td>
</tr>
<tr>
<td align="left">NH<sub>4</sub>OH</td>
<td align="left">1&#xa0;ml/L</td>
</tr>
<tr>
<td align="left">Solution pH</td>
<td align="left">8.5</td>
</tr>
</tbody>
</table>
</table-wrap>
<fig id="F3" position="float">
<label>FIGURE 3</label>
<caption>
<p>Dependence of current efficiency (CE) of CoPt thin films on H<sub>2</sub>PtCl<sub>6</sub> concentration and solution pH.</p>
</caption>
<graphic xlink:href="fchem-09-733383-g003.tif"/>
</fig>
<fig id="F4" position="float">
<label>FIGURE 4</label>
<caption>
<p>Dependence of coercivity and squareness of CoPt thin films on H<sub>2</sub>PtCl<sub>6</sub> concentration <bold>(A)</bold> coercivity and <bold>(B)</bold> squareness.</p>
</caption>
<graphic xlink:href="fchem-09-733383-g004.tif"/>
</fig>
<fig id="F5" position="float">
<label>FIGURE 5</label>
<caption>
<p>Dependence of coercivity and squareness of CoPt thin films and solution pH <bold>(A)</bold> coercivity and <bold>(B)</bold> squareness.</p>
</caption>
<graphic xlink:href="fchem-09-733383-g005.tif"/>
</fig>
<fig id="F6" position="float">
<label>FIGURE 6</label>
<caption>
<p>Dependence of current efficiency (CE) of CoPt thin films on current density (CD) (The values of CE in the red curve are similar or lower than that in <xref ref-type="fig" rid="F1">Figures 1</xref>, <xref ref-type="fig" rid="F3">3</xref>).</p>
</caption>
<graphic xlink:href="fchem-09-733383-g006.tif"/>
</fig>
<fig id="F7" position="float">
<label>FIGURE 7</label>
<caption>
<p>Dependence of coercivity and squareness of CoPt thin films on current density (CD) <bold>(A)</bold> coercivity and <bold>(B)</bold> squareness.</p>
</caption>
<graphic xlink:href="fchem-09-733383-g007.tif"/>
</fig>
<fig id="F8" position="float">
<label>FIGURE 8</label>
<caption>
<p>Dependence of coercivity and squareness of CoPtP thin films on current density (CD) <bold>(A)</bold> coercivity and <bold>(B)</bold> squareness.</p>
</caption>
<graphic xlink:href="fchem-09-733383-g008.tif"/>
</fig>
<fig id="F9" position="float">
<label>FIGURE 9</label>
<caption>
<p>Dependence of coercivity and squareness of CoPtP thin films on NaH<sub>2</sub>PO<sub>2</sub> concentration <bold>(A)</bold> coercivity and <bold>(B)</bold> squareness.</p>
</caption>
<graphic xlink:href="fchem-09-733383-g009.tif"/>
</fig>
<p>Deposit Co and Pt contents in CoPt and CoPtP thin films were analyzed using atomic absorption spectroscopy (AAS). P content in the CoPtP thin films could not be analyzed using both AAS and energy dispersive spectroscopy (EDS) because of interference between Pt and P elements. Magnetic properties such as coercivity (H<sub>C</sub>) and squareness (S &#x3d; M<sub>r</sub>/M<sub>S</sub>) were measured using a vibrating sample magnetometer (VSM) (Model 880, ADE technologies Inc.). Microstructures of CoPt and CoPtP thin films were examined using an X-ray diffractometer (XRD) (Model 42202, Norelco, North American Phillips Company Inc.) with K<sub>&#x3b1;</sub> radiation to identify the phases. Conditions of XRD were a scanning range of 20&#x2013;100&#xb0; with 0.03&#xb0; increments and a one second dwell&#x20;time.</p>
</sec>
<sec sec-type="results|discussion" id="s3">
<title>Results and Discussion</title>
<p>
<xref ref-type="fig" rid="F1">Figure&#x20;1</xref> shows the dependence of Co and Pt contents in electrodeposits and current efficiency (CE) on Co<sup>2&#x2b;</sup> concentrations. Deposited Co content in electrodeposits increased from 82 to 90&#xa0;wt% with increasing Co<sup>2&#x2b;</sup> concentration from 0.005 to 0.1 M, while Pt content decreased from 19 to 10&#xa0;wt%. Current efficiency increased from 4 to 22%. Very limited work for deposit Co content and current efficiency in CoPt alloy was reported. Dragos-Pinzaru et&#x20;al. electrodeposited CoPt films from hexachloroplatinate solutions: 0.4&#xa0;M H<sub>3</sub>BO<sub>3</sub>, 0.3&#x20;M NH<sub>4</sub>Cl, 0.1&#xa0;M CoSO<sub>4</sub>&#x2219;7H<sub>2</sub>O, 0.00386&#xa0;M H<sub>2</sub>PtCl<sub>6</sub> with/without 3.89&#xa0;mM saccharin (<xref ref-type="bibr" rid="B5">Dragos-Pinzaru et&#x20;al., 2017</xref>). They reported deposit Co content of 28.8&#x2013;66.9&#xa0;wt% (56&#x2013;87&#xa0;at%) with the change of deposit time from 10&#xa0;s to 300&#xa0;s. Deposit Co content of 82&#x2013;90&#xa0;wt% in this study is significantly higher than that (28.8&#x2013;66.9&#xa0;wt%) in the article reported by Dragos-Pinzaru et&#x20;al. (<xref ref-type="bibr" rid="B4">Dragos-Pinzaru et&#x20;al., 2017</xref>). Also, they investigated the effect of deposit time on current efficiency at different pH and different Co<sup>&#x2b;2</sup> ion concentration and reported the current efficiency of 55&#x2013;68% and 55&#x2013;78% with the change of deposit time, respectively. They reported about 2.5&#x2013;20&#x20;times higher current efficiency (55&#x2013;78%) than that (4&#x2013;22%) of this study. Relatively low current efficiency in this study compared to that reported by Dragos-Pinzaru et&#x20;al. (<xref ref-type="bibr" rid="B4">Dragos-Pinzaru et&#x20;al., 2017</xref>) may be attributed to the different chemical compositions. That is, the applied current in this paper was used very much in side reactions such as the evolution of hydrogen gases on cathode and oxygen gases on&#x20;anode.</p>
<p>
<xref ref-type="fig" rid="F2">Figure&#x20;2</xref> shows the dependence of hard magnetic properties (<italic>i.e.,</italic> coercivity and squareness) of binary CoPt electrodeposits. The optimum Co<sup>2&#x2b;</sup> concentrations with high coercivity were observed in the range of 0.03&#x2013;0.07&#xa0;M. In this range of Co<sup>2&#x2b;</sup> concentrations, parallel coercivities ranged from &#x223c;1,400 to &#x223c;1,600&#xa0;Oe whereas perpendicular coercivities ranged from &#x223c;2,200 to &#x223c;2,800&#xa0;Oe. On the other hand, parallel and perpendicular squareness (S<sub>//</sub> and S<sub>&#x22a5;</sub>) were measured to be ranged from &#x223c;0.2 to &#x223c;0.5 and about 0.25, respectively. Tabakovic et&#x20;al. obtained the coercivity of H<sub>C,//</sub> &#x3d; 221&#xa0;Oe and H<sub>C,&#x22a5;</sub> &#x3d; 254&#xa0;Oe from Co<sub>80</sub>Pt<sub>20</sub> films deposited on Cu substrate [oxidized Si wafer/Ta (5&#xa0;nm)/Cu (200&#xa0;nm)/CoPt (15&#x2013;20&#xa0;nm)] (<xref ref-type="bibr" rid="B15">Tabakovic et&#x20;al., 2016</xref>). Also the coercivity of H<sub>C,//</sub> &#x3d; 629&#xa0;Oe and H<sub>C,&#x22a5;</sub> &#x3d; 1,220&#xa0;Oe in Co<sub>80</sub>Pt<sub>20</sub> films deposited on Ru substrate [oxidized Si wafer/Ta (5&#xa0;nm)/Ru (200&#xa0;nm)/CoPt (15&#x2013;20&#xa0;nm)] was reported. It is well known that perpendicular anisotropy of CoPt films obtained either by electrodeposition or vacuum deposition highly depend on the underlayer types such as Cu and Ru (<xref ref-type="bibr" rid="B19">Wierman et&#x20;al., 2002</xref>; <xref ref-type="bibr" rid="B14">Pattanaik et&#x20;al., 2006</xref>; <xref ref-type="bibr" rid="B18">Vokoun et&#x20;al., 2006</xref>; <xref ref-type="bibr" rid="B20">Wodarz et&#x20;al., 2016</xref>). Because, in this study, brass substrate was used and parallel coercivities ranged from &#x223c;1,400 to &#x223c;1,600&#xa0;Oe and perpendicular coercivities ranged from &#x223c;2,200 to &#x223c;2,800&#xa0;Oe were obtained, we can suggest that the type of substrate strongly affects coercivities of CoPt&#x20;films.</p>
<p>
<xref ref-type="fig" rid="F3">Figure&#x20;3</xref> shows the dependence of current efficiency on H<sub>2</sub>PtCl<sub>6</sub> concentration and solution pH in the baths. Current efficiency decreased from 22 to 17% with increasing H<sub>2</sub>PtCl<sub>6</sub> concentration. No work for the dependence of the change of H<sub>2</sub>PtCl<sub>6</sub> concentration on current efficiency in CoPt alloy was reported as far as we know. Current efficiency as a function of CoSO<sub>4</sub> concentration (0.1 and 0.25&#xa0;M) in the bath for electrodeposited CoPt films was measured by Dragos-Pinzaru et&#x20;al. (<xref ref-type="bibr" rid="B4">Dragos-Pinzaru et&#x20;al., 2017</xref>). They reported that the bath with higher concentration of 0.25&#xa0;M CoSO<sub>4</sub> exhibits the current efficiency of about 61&#x2013;65%, while the bath with lower concentration of 0.1&#xa0;M CoSO<sub>4</sub> shows the current efficiency of about 55&#x2013;60%. The change of CoSO<sub>4</sub> concentration in the bath resulted in the decrease of about 6% in current efficiency. However, it was reported that deposit Co content in CoPt films was almost the same as 66.9&#xa0;wt% (87&#xa0;at%) for both concentrations of 0.1 and 0.25&#xa0;M CoSO<sub>4</sub> in the bath. Therefore, some decrease of current efficiency from 22 to 17% with increasing H<sub>2</sub>PtCl<sub>6</sub> concentration in this study is expected. Because the increase of Co<sup>2&#x2b;</sup> concentration in the bath (see <xref ref-type="fig" rid="F1">Figure&#x20;1</xref>) from 0 to 0.1&#xa0;M results in the decrease of deposit Pt content and the increase of deposit Co content in the CoPt films, we can suggest that more Co<sup>2&#x2b;</sup> concentration in the bath means more deposit Co content in CoPt films; more H<sub>2</sub>PtCl<sub>6</sub> concentration in the bath gives more deposit Pt content in the CoPt films, resulting in the decrease of current efficiency.</p>
<p>The dependence of current efficiency on solution pH is also shown in <xref ref-type="fig" rid="F3">Figure&#x20;3</xref>. Maximum current efficiency (&#x223c;20%) was obtained at pH 9. Dragos-Pinzaru et&#x20;al. investigated the influence of solution pH (2.5 and 5.5) on the current efficiency of electrodeposited CoPt films from hexachloroplatinate solutions (<xref ref-type="bibr" rid="B4">Dragos-Pinzaru et&#x20;al., 2017</xref>). They reported that the current efficiency in the bath with pH 2.5 and 5.5 was measured to be about 62 and 66%, respectively. We believe from <xref ref-type="fig" rid="F1">Figure&#x20;1</xref> that about three times higher current efficiency of CoPt films reported by Dragos-Pinzaru et&#x20;al. (<xref ref-type="bibr" rid="B4">Dragos-Pinzaru et&#x20;al., 2017</xref>) than that of this study may be attributed to the different chemical compositions in the baths. The change of solution pH somewhat has an influence on the current efficiency. The current efficiency highly depends on the chemical compositions in the baths rather than solution&#x20;pH.</p>
<p>
<xref ref-type="fig" rid="F4">Figure&#x20;4</xref> shows the dependence of coercivity and squareness of binary CoPt thin film alloys on H<sub>2</sub>PtCl<sub>6</sub> concentration. This experimental work was carried out in order to find higher coercivity of CoPt films in the bath compositions and operating conditions as shown in <xref ref-type="table" rid="T1">Table&#x20;1</xref>. The optimum coercivity (H<sub>C,//</sub> &#x3d; &#x223c;1,000&#xa0;Oe and H<sub>C,&#x22a5;</sub> &#x3d; &#x223c;2,700&#xa0;Oe) was obtained at 0.01&#xa0;M Pt concentration, while parallel and perpendicular squarenesses were measured as &#x223c;0.18 and &#x223c;0.3, respectively.</p>
<p>
<xref ref-type="fig" rid="F5">Figure&#x20;5</xref> shows the dependence of coercivity and squareness of CoPt alloys on solution pH. The optimum coercivity (H<sub>C,//</sub> &#x3d; &#x223c;1,250&#xa0;Oe and H<sub>C,&#x22a5;</sub> &#x3d; &#x223c;1,300&#xa0;Oe) was obtained at solution pH 8&#x2013;9. Parallel and perpendicular squarenesses at solution pH 8&#x2013;9 were measured as &#x223c;0.6 and &#x223c;0.1, respectively. It was observed that the change of solution pH has a considerable effect on the coercivity of CoPt&#x20;films.</p>
<p>
<xref ref-type="fig" rid="F6">Figure&#x20;6</xref> exhibits the dependence of current efficiency of binary CoPt and ternary CoPtP electrodeposits on current density. The current efficiencies were slightly decreased with increasing current density for both CoPt and CoPtP electrodeposits. The addition of 0.1&#xa0;M NaH<sub>2</sub>PO<sub>2</sub> in the plating bath resulted in the slight decrease of current efficiency from 10 to 7%. Dragos-Pinzaru et&#x20;al. investigated the influence of saccharin (with/without 3.89&#xa0;mM) as an additive on current efficiency of CoPt films electrodeposited from hexachloroplatinate solutions (<xref ref-type="bibr" rid="B4">Dragos-Pinzaru et&#x20;al., 2017</xref>). Higher current efficiency (78%) was observed in CoPt films electrodeposited from the bath containing no saccharin, while CoPt films electrodeposited from the bath containing 3.89&#xa0;mM saccharin exhibits lower current efficiency (66%). Therefore, we can suggest that the current efficiency obtained in CoPt films electrodeposited from hexachloroplatinate solutions was influenced by the type of additive such as saccharin (<xref ref-type="bibr" rid="B4">Dragos-Pinzaru et&#x20;al., 2017</xref>) or sodium hypophosphite (NaH<sub>2</sub>PO<sub>2</sub>) (this study). In this study, the current efficiency was measured as 22% at the most or less. Therefore, we can summarize from <xref ref-type="fig" rid="F1">Figures 1</xref>, <xref ref-type="fig" rid="F3">3</xref>, <xref ref-type="fig" rid="F6">6</xref> that current efficiency obtained in CoPt films electrodeposited from hexachloroplatinate solutions much depend on the bath compositions rather than the type of additives, solution pH, CoSO<sub>4</sub>, and H<sub>2</sub>PtCl<sub>6</sub>. That is, current efficiencies in the baths used by Dragos-Pinzaru et&#x20;al. (<xref ref-type="bibr" rid="B4">Dragos-Pinzaru et&#x20;al., 2017</xref>) were much higher than that in the baths used by this&#x20;study.</p>
<p>
<xref ref-type="fig" rid="F7">Figures 7</xref>, <xref ref-type="fig" rid="F8">8</xref> show the corresponding coercivity and squareness of binary CoPt (<xref ref-type="fig" rid="F7">Figure&#x20;7</xref>; electrodeposited from the bath containing no NaH<sub>2</sub>PO<sub>2</sub>) and ternary CoPtP electrodeposits (<xref ref-type="fig" rid="F8">Figure&#x20;8</xref>; electrodeposited from bath containing 0.1&#xa0;M NaH<sub>2</sub>PO<sub>2</sub>). <xref ref-type="fig" rid="F7">Figures 7</xref>, <xref ref-type="fig" rid="F8">8</xref> were carried out at optimum conditions (using the conditions from <xref ref-type="table" rid="T1">Table&#x20;1</xref>; Co<sup>2&#x2b;</sup> and Pt<sup>4&#x2b;</sup> concentrations, solution pH, and current density) in order to get the best coercivity in CoPt films. In binary CoPt electrodeposits, high coercivity (H<sub>C,//</sub> &#x3d; &#x223c;1,600&#xa0;Oe and H<sub>C,&#x22a5;</sub> &#x3d; &#x223c;2,100&#xa0;Oe) was obtained at the current density of 7.5&#xa0;mA/cm<sup>2</sup>. On the other hand, parallel and perpendicular squarenesses at the current density of 7.5&#xa0;mA/cm<sup>2</sup> were measured as &#x223c;0.35 and &#x223c;0.2, respectively. There is no research work for the effect of adding sodium hypophosphite (NaH<sub>2</sub>PO<sub>2</sub>) into the baths for binary CoPt thin films. In ternary CoPtP electrodeposits of this study (<xref ref-type="fig" rid="F8">Figure&#x20;8</xref>), high coercivity (H<sub>C,//</sub> &#x3d; &#x223c;3,000&#xa0;Oe and H<sub>C,&#x22a5;</sub> &#x3d; &#x223c;3,500&#xa0;Oe) was obtained from 7.5 to 20&#xa0;mA/cm<sup>2</sup>. Also, parallel and perpendicular squarenesses at the current density of 7.5&#x2013;20&#xa0;mA/cm<sup>2</sup> were measured as &#x223c;0.4 and 0.2&#x2013;0.4, respectively.</p>
<p>
<xref ref-type="fig" rid="F9">Figure&#x20;9</xref> shows the dependence of coercivity and squareness of CoPtP alloys on NaH<sub>2</sub>PO<sub>2</sub> concentration in the plating baths. Parallel coercivity increased from &#x223c;1,700 to &#x223c;2,700&#xa0;Oe with increasing NaH<sub>2</sub>PO<sub>2</sub> concentration from 0.01 to 0.8 M, while perpendicular coercivity was maintained at the range of 3,000&#x2013;3,500&#xa0;Oe. Perpendicular squareness was slightly increased and parallel squareness was increased from &#x223c;0.2 to 0.37 with increasing NaH<sub>2</sub>PO<sub>2</sub> concentration. The addition effect of NaH<sub>2</sub>PO<sub>2</sub> concentration in the bath for electrodeposited CoPt films was much higher in parallel coercivity than in perpendicular coercivity. Also, the similar effect both for parallel and perpendicular squarness was observed.</p>
<p>
<xref ref-type="fig" rid="F10">Figure&#x20;10</xref> shows XRD patterns of binary CoPt and CoPtP thin film alloys with increasing NaH<sub>2</sub>PO<sub>2</sub> concentration in the baths. For the binary CoPt thin film, it is analyzed that CoPt thin films consist of mainly amorphous crystalline and small intensity of CoPt<sub>3</sub> (111) phases (JCPDS file &#x23;: 29&#x2013;499). For the ternary CoPtP thin film, CoPtP thin films consist of both amorphous crystalline and Co<sub>2</sub>P (130) (JCPDS file &#x23;: 6&#x2013;306) [or Pt<sub>5</sub>P<sub>2</sub> (<inline-formula id="inf1">
<mml:math id="m1">
<mml:mrow>
<mml:mrow>
<mml:mover accent="true">
<mml:mn>2</mml:mn>
<mml:mo>&#xaf;</mml:mo>
</mml:mover>
</mml:mrow>
<mml:mn>22</mml:mn>
</mml:mrow>
</mml:math>
</inline-formula>) (JCPDS file &#x23;: 23&#x2013;465)] peaks. The addition of NaH<sub>2</sub>PO<sub>2</sub> into the baths for the binary CoPt films results in the considerable increase of intensity of Co<sub>2</sub>P (130) (JCPDS file &#x23;: 6&#x2013;306) [or Pt<sub>5</sub>P<sub>2</sub> (<inline-formula id="inf2">
<mml:math id="m2">
<mml:mrow>
<mml:mrow>
<mml:mover accent="true">
<mml:mn>2</mml:mn>
<mml:mo>&#xaf;</mml:mo>
</mml:mover>
</mml:mrow>
<mml:mn>22</mml:mn>
</mml:mrow>
</mml:math>
</inline-formula>) (JCPDS file &#x23;: 23&#x2013;465)] peaks. Tabakovic et&#x20;al. investigated the influence of different substrates (Cu and Ru) on the peaks in XRD patterns in CoPt films electrodeposited from hexachloroplatinate solutions (<xref ref-type="bibr" rid="B15">Tabakovic et&#x20;al., 2016</xref>). Zana et&#x20;al. also reported the same results of XRD using electrodeposited CoPt on Cu seed layer (<xref ref-type="bibr" rid="B21">Zana and Zangari, 2004</xref>). It was reported that CoPt films electrodeposited on Cu substrate [oxidized Si wafer/Ta (5&#xa0;nm)/Cu (200&#xa0;nm)/CoPt (15&#x2013;20&#xa0;nm)] consists of hcp CoPt (10.0), (00.2) and (10.1), at 41.2&#xb0;, 43.4&#xb0;, 46.4&#xb0; 2&#x3b8; values, respectively (<xref ref-type="bibr" rid="B15">Tabakovic et&#x20;al., 2016</xref>). On the other hand, CoPt films electrodeposited on Ru substrate [oxidized Si wafer/Ta (5&#xa0;nm)/Ru (200&#xa0;nm)/CoPt (15&#x2013;20&#xa0;nm)] exhibits hcp CoPt (10.0) and (00.2) at 41.2&#xb0; and 43.4&#xb0; 2&#x3b8; values, respectively (<xref ref-type="bibr" rid="B15">Tabakovic et&#x20;al., 2016</xref>).</p>
<fig id="F10" position="float">
<label>FIGURE 10</label>
<caption>
<p>XRD patterns of CoPt and CoPtP thin films electrodeposited on brass substrate with the change of NaH<sub>2</sub>PO<sub>2</sub> concentration in the plating baths; relative intensity vs NaH<sub>2</sub>PO<sub>2</sub> concentration (S: substrate).</p>
</caption>
<graphic xlink:href="fchem-09-733383-g010.tif"/>
</fig>
<p>It was reported that Ru underlayer results in both the improvement of the microstructure [absence of hcp CoPt (00.2)] and enhancement of perpendicular anisotropy (H<sub>C,//</sub>&#x3d; 629&#xa0;Oe and H<sub>C,&#x22a5;</sub> &#x3d; 1,220&#xa0;Oe) in CoPt films (<xref ref-type="bibr" rid="B15">Tabakovic et&#x20;al., 2016</xref>). The same results were observed in CoPt films obtained either by vacuum deposition or electrodeposition (<xref ref-type="bibr" rid="B15">Tabakovic et&#x20;al., 2016</xref>; <xref ref-type="bibr" rid="B14">Pattanaik et&#x20;al., 2006</xref>; <xref ref-type="bibr" rid="B20">Wodarz et&#x20;al., 2016</xref>; <xref ref-type="bibr" rid="B19">Wierman et&#x20;al., 2002</xref>; <xref ref-type="bibr" rid="B18">Vokoun et&#x20;al., 2006</xref>). Also, Dragos-Pinzaru et&#x20;al. reported that very high perpendicular coercivity (H<sub>C,&#x22a5;</sub> &#x3d; 4,500&#x2013;6,700&#xa0;Oe) in CoPt films is attributed to both Ru substrate and thickness (10&#x2013;30&#xa0;nm) of CoPt film (<xref ref-type="bibr" rid="B4">Dragos-Pinzaru et&#x20;al., 2017</xref>). They suggested that high perpendicular coercivity of Co<sub>71</sub>Pt<sub>21</sub> film (&#x223c;15&#xa0;nm thickness) deposited on Ru seed layer is resulted from the addition of saccharin in the baths, resulting in the dramatic improvement of hcp (00.2) crystal structure. However, in this study, the binary CoPt film electrodeposited on brass substrate mainly consists of nanocrystalline with only a very small intensity of CoPt<sub>3</sub> (111) peak (JCPDS file &#x23;: 29&#x2013;499). On the other hand, the ternary CoPtP film electrodeposited in the baths containing NaH<sub>2</sub>PO<sub>2</sub> showed the dramatic improvement of Co<sub>2</sub>P (130) [or Pt<sub>5</sub>P<sub>2</sub> (<inline-formula id="inf3">
<mml:math id="m3">
<mml:mrow>
<mml:mrow>
<mml:mover accent="true">
<mml:mn>2</mml:mn>
<mml:mo>&#xaf;</mml:mo>
</mml:mover>
</mml:mrow>
<mml:mn>22</mml:mn>
</mml:mrow>
</mml:math>
</inline-formula>)] peaks, resulting in the increase of parallel coercivity from &#x223c;1,700&#xa0;Oe to &#x223c;3,000&#xa0;Oe and the increase of perpendicular coercivity from &#x223c;3,200&#xa0;Oe to &#x223c;3,700&#xa0;Oe. These results in this study may be attributed to the different substrate (brass) and the different bath compositions compared to previous papers reported by another researcher (<xref ref-type="bibr" rid="B15">Tabakovic et&#x20;al., 2016</xref>; <xref ref-type="bibr" rid="B4">Dragos-Pinzaru et&#x20;al., 2017</xref>). Some important results in CoPt/CoPtP films (for high coercivities) were tabulated in <xref ref-type="table" rid="T3">Table&#x20;3</xref> to compare each&#x20;other.</p>
<table-wrap id="T3" position="float">
<label>TABLE 3</label>
<caption>
<p>Comparison of some important results representing high coercivities in CoPt/CoPtP thin&#x20;films.</p>
</caption>
<table>
<thead valign="top">
<tr>
<th colspan="2" align="left">Coercivity (Oe)</th>
<th rowspan="2" align="center">Alloy/substrate</th>
<th rowspan="2" align="center">References</th>
</tr>
<tr>
<th align="left">H<sub>c,//</sub>
</th>
<th align="left">H<sub>c,&#x22a5;</sub>
</th>
</tr>
</thead>
<tbody valign="top">
<tr>
<td align="left">629</td>
<td align="left">1,220</td>
<td align="left">CoPt/Ru</td>
<td align="left">
<xref ref-type="bibr" rid="B15">Tabakovic et&#x20;al. (2016)</xref>
</td>
</tr>
<tr>
<td align="left">221</td>
<td align="left">254</td>
<td align="left">CoPt/Cu</td>
<td align="left"/>
</tr>
<tr>
<td align="left">&#x2014;</td>
<td align="left">4,500&#x2013;6,700</td>
<td align="left">CoPt (10&#x2013;30&#xa0;nm thick)/Ru</td>
<td align="left">
<xref ref-type="bibr" rid="B4">Dragos-Pinzaru et&#x20;al. (2017)</xref>
</td>
</tr>
<tr>
<td align="left">1700&#x2013;3,000</td>
<td align="left">3,200&#x2013;3,700</td>
<td align="left">CoPt/brass</td>
<td align="left">This study</td>
</tr>
</tbody>
</table>
</table-wrap>
<p>In summary, it is believed that the coercivity and XRD patterns [<xref ref-type="fig" rid="F9">Figures 9</xref>, <xref ref-type="fig" rid="F10">10</xref>] in this study are affected not only by the type of substrate but also by chemical composition and operating conditions in the baths for electrodeposition. Although there is neither SEM image nor optical microscope image in this study, the smooth, bright and shiny surfaces of all the CoPt and CoPtP thin films were observed.</p>
</sec>
<sec sec-type="conclusion" id="s4">
<title>Conclusion</title>
<p>Magnetic CoPt and CoPtP thin film alloys were fabricated by electrodeposition process from the baths containing chloroplatinic acid, cobalt pyrophosphate and sodium hypophosphite. Influence of several electrodeposition parameters such as solution compositions (e.g [Pt<sup>4&#x2b;</sup>] [Co<sup>2&#x2b;</sup>] and [NaH<sub>2</sub>PO<sub>2</sub>]), solution pH, current density on current efficiency, magnetic properties, and microstructure was systematically investigated. It is believed that relatively low current efficiency in this article compared to that reported by Dragos-Pinzaru et&#x20;al. (<xref ref-type="bibr" rid="B4">Dragos-Pinzaru et&#x20;al., 2017</xref>) may be attributed to the different chemical compositions because of much more current consumption in the evolution of side reactions in this study. Parallel coercivities ranged from &#x223c;1,400 to &#x223c;1,600&#xa0;Oe and perpendicular coercivities ranging from &#x223c;2,200 to &#x223c;2,800&#xa0;Oe for binary CoPt films in this article were obtained. It is believed that the type of substrate strongly affects coercivities of CoPt films. Also, more Co-pyrophosphate concentration in the bath results in more deposit Co content in CoPt films; more H<sub>2</sub>PtCl<sub>6</sub> concentration in the bath more deposit Pt content. Current efficiency obtained in CoPt films electrodeposited from hexachloroplatinate solutions much depend on the bath compositions rather than the type of additives, solution pH, CoSO<sub>4</sub>, and H<sub>2</sub>PtCl<sub>6</sub>. In summary, the XRD patterns and coercivity in this study are affected by both the type of substrates and chemical composition and operating conditions in the baths for electrodeposition.</p>
</sec>
</body>
<back>
<sec id="s5">
<title>Data Availability Statement</title>
<p>The original contributions presented in the study are included in the article/<xref ref-type="sec" rid="s9">Supplementary Material</xref>, further inquiries can be directed to the corresponding author.</p>
</sec>
<sec id="s6">
<title>Author Contributions</title>
<p>All authors listed have made a substantial, direct, and intellectual contribution to the work and approved it for publication.</p>
</sec>
<sec sec-type="COI-statement" id="s7">
<title>Conflict of Interest</title>
<p>The authors declare that the research was conducted in the absence of any commercial or financial relationships that could be construed as a potential conflict of interest.</p>
</sec>
<sec id="s8" sec-type="disclaimer">
<title>Publisher&#x2019;s Note</title>
<p>All claims expressed in this article are solely those of the authors and do not necessarily represent those of their affiliated organizations, or those of the publisher, the editors and the reviewers. Any product that may be evaluated in this article, or claim that may be made by its manufacturer, is not guaranteed or endorsed by the publisher.</p>
</sec>
<sec id="s9">
<title>Supplementary Material</title>
<p>The Supplementary Material for this article can be found online at: <ext-link ext-link-type="uri" xlink:href="https://www.frontiersin.org/articles/10.3389/fchem.2021.733383/full#supplementary-material">https://www.frontiersin.org/articles/10.3389/fchem.2021.733383/full&#x23;supplementary-material</ext-link>
</p>
<supplementary-material xlink:href="DataSheet1.PDF" id="SM1" mimetype="application/PDF" xmlns:xlink="http://www.w3.org/1999/xlink"/>
</sec>
<ref-list>
<title>References</title>
<ref id="B1">
<citation citation-type="book">
<person-group person-group-type="author">
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